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  3. Modern RF and Microwave Measurement Techniques
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  • Publisher:
    Cambridge University Press
    Publication date:
    05 June 2013
    20 June 2013
    ISBN:
    9781139567626
    9781107036413
    DOI:
    https://doi.org/10.1017/CBO9781139567626
    Dimensions:
    (247 x 174 mm)
    Weight & Pages:
    1kg, 471 Pages
    Dimensions:
    Weight & Pages:
    • Subjects:
    Engineering, Electronic, Optoelectronic Devices, and Nanotechnology, Circuits and Systems, RF and Microwave Engineering
    Series:
    The Cambridge RF and Microwave Engineering Series
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    Subjects:
    Engineering, Electronic, Optoelectronic Devices, and Nanotechnology, Circuits and Systems, RF and Microwave Engineering
    Series:
    The Cambridge RF and Microwave Engineering Series
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    Book description

    This comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement combines microwave circuit theory and metrology, in-depth analysis of advanced modern instrumentation, methods and systems, and practical advice for professional RF and microwave engineers and researchers. Topics covered include microwave instrumentation, such as network analyzers, real-time spectrum analyzers and microwave synthesizers; linear measurements, such as VNA calibrations, noise figure measurements, time domain reflectometry and multiport measurements; and non-linear measurements, such as load- and source-pull techniques, broadband signal measurements, and non-linear NVAs. Each technique is discussed in detail and accompanied by state-of-the-art solutions to the unique technical challenges associated with its use. With each chapter written by internationally recognised experts in the field, this is an invaluable resource for researchers and professionals involved with microwave measurements.

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