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An Instrument for Soft X-Ray Selected-Area Microdiffraction*

Published online by Cambridge University Press:  06 March 2019

H. H. Pattee*
Affiliation:
Stanford University Stanford, California
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Abstract

An instrument for soft X-ray selected-area microd infraction has been constructed fulfilling the principles of optimum intensity for given specimen size and resolution, and permitting direct visual beam focusing and alignment for specimen sizes in the 1-10 μ region. The X-ray source is a modified, two-lens, microfocus tube manufactured by Canal Industrial Corporation supplemented by a camera, specimen stage, and incident-light microscope. Target-to-film distance may be adjusted from 50 μ to several millimeters which allows the use of wavelengths as long as Al K radiation in air. The use of soft radiation for microsamples simplifies the collimation requirements and permits shorter specimen-to-film distance for a given resolution. Collimating apertures are punched in foil with etched tungsten points or with the microfocus electron beam. Results confirm the prediction that microsamples do not require excessive exposure times using optimum geometry for source size and camera dimensions.

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Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1964

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