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Application of a New Solid State X-Ray Camera to Stress Measurement

Published online by Cambridge University Press:  06 March 2019

M.A. Korhonen,
V.K. Lindroos and
L.S. Suominen
M.A. Korhonen
Affiliation:
Helsinki University of Technology, Laboratory of Materials Science, 02150 Espoo, Finland
V.K. Lindroos
Affiliation:
Helsinki University of Technology, Laboratory of Materials Science, 02150 Espoo, Finland
L.S. Suominen
Affiliation:
Mexpert Instrument Technology Ltd., Otanieini Science Park, 02150 Espoo, Finland
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Extract

X-ray camera methods of stress measurement are inherently flexible and easy to apply in different situations because of the low weight, portability and maneuverability of the equipment. However, the digital intensity recording with the resulting objectivity and better statistical accuracy has given the diffractometer methods a distinct advantage over the conventional camera methods.

Information

Type
VII. X-Ray Stress Analysis
Information
Advances in X-Ray Analysis , Volume 32: Thirty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-5, 1988 , 1988, pp. 407 - 413
Copyright
Copyright © International Centre for Diffraction Data 1988

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References

1. Cullity, B.D., Elements of X-ray Diffraction, 2nd ed. , Addison-Wesley, 1978 Google Scholar
2. Simomaa, K., Kelha, V., Tuomi, T., Korhonen, M.A., and Suominen, L., Proc. Conf. Image Detection and Quality, July 16-18, 1986, Paris, 203Google Scholar
3. Koppel, L.N., Adv. X-Ray Anal. 19: 587 (1976)Google Scholar
4. Laumspach, J., Bourgade, J.L., Cavailler, C., de Mascureau, J., Mens, A. and R. Saunef, SPIE 689:244 (1986)Google Scholar
5. Cullity, B.D., Elements of X-ray Diffraction, Addison-Wesley, first ed. 1956Google Scholar
6. Korhonen, M.A. and Lindroos, V.K., Scand. J. Metallurgy 2:101 (1973)Google Scholar
7. Macherauch, E. and Wolfstieg, U., Adv. X-Ray Anal. 20: 369 (1977)Google Scholar
8. Korhonen, M.A., D. Sc. Thesis, Helsinki Univ. of Technology, 1980Google Scholar
9. Tönschoff, K., Brinkstneier, E., and Nölke, H.H., Z. Metallkde 72:349 (1981)Google Scholar