Hostname: page-component-7b7567c8c-2n9c9 Total loading time: 0 Render date: 2026-11-15T14:08:49.979Z Has data issue: false hasContentIssue false

Applications of On-Line XRF and XRD Analysis Techniques to Industrial Process Control

Published online by Cambridge University Press:  06 March 2019

Mattt Hietala
Affiliation:
Outokumpu Oy, Espoo, Finland
Dennis J. Kalnicky
Affiliation:
Princeton Gamma-Tech, Princeton, New Jersey
Get access

Extract

Temperature, pressure, and flow measurements are considered standard for process control purposes. It is vital that they be made on-line in real-time and not manually in the laboratory. Chemical assays should be done as fast and continuous as temperature measurements in order to be useful for process control. Until recently, this has not been the case because the assay methods have been difficult to automate.

Information

Type
II. On-Line X-Ray Analysis
Copyright
Copyright © International Centre for Diffraction Data 1988

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable