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Applications of Whole-Powder-Pattern Fitting Technique in Materials Characterization

Published online by Cambridge University Press:  06 March 2019

Hideo Toraya
Hideo Toraya*
Affiliation:
Ceramics Research Laboratory, Nagoya Institute of Technology Asahigaoka, Tajimi 507, Japan
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The development of powder-pattern-fitting techniques greatly changed the methodological aspect of materials characterization using powder diffraction data. Pencil and ruler are going out of use in modern powder data analysis, and present-day materials scientists hit a keyboard and manipulate a mouse of computer for deducing the final parameters of the model, which gives the best fit of calculated pattern to the observed one on a CRT screen. Computer software is now widespread, and the success in materials characterization becomes much dependent on their availability.

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Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993, pp. 37 - 47
Copyright
Copyright © International Centre for Diffraction Data 1993

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