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A Camera for Borrmann Stereo X-Ray Topographs

Published online by Cambridge University Press:  06 March 2019

F. W. Young Jr.,
T. O. Baldwin,
A. E. Merlini and
F. A. Sherrill
F. W. Young Jr.
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
T. O. Baldwin
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
A. E. Merlini
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
F. A. Sherrill
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
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Abstract

A relatively inexpensive camera which was designed for taking Borrmann topographs with standard X-ray diffraction equipment is described. This camera has been used to take stereo pairs of Borrmann topographs by rotating the crystal around an axis normal to the diffraction planes. Topographs have been taken of nearly perfect copper crystals up to 0.2 cm thick using silver, molybdenum, copper, and chromium radiation, and comparisons have been made with topographs obtained with crystal monochromated radiation. Geometrical factors affecting the resolving power of the technique are briefly reviewed. In addition, the resolution inherent in the diffraction phenomenon is analyzed on the basis of the theory of anomalous transmission. Comparisons are made between calculated and observed image widths of a few dislocations.

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Type
Research Article
Information
Advances in X-Ray Analysis , Volume 9: Fourteenth Annual Conference on Applications of X-ray Analysis, August 25-27, 1965 , 1965, pp. 1 - 13
Copyright
Copyright © International Centre for Diffraction Data 1965

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References

1. Webb, W. W., “X-Ray Diffraction Topography,” in: J. B. Newkirk and J, H. Wernick, Direct Observation of Imperfections in Crystals, Interscience Publishers, Inc., New York, 1962, p. 29.Google Scholar
2. Lang, A. R., “X-Ray Diffraction; Topography,” in: G. L. Clark, Encyclopedia of X-Rays and Gamma Rays, Reinhold Publishing Corp., New York, 1963, p. 1053.Google Scholar
3. Meriini, A. and Pace, S., “Anomalous Transmission in Zinc Crystals,” Nuovo Cimento, Suppl, 1: 531, 1963.Google Scholar
4. Wittels, M. C., Sherrill, F. A., and Young, F. W. Jr., “Anomalous Transmission of X-Rays in Copper Crystals” Appl. Phys. Letters 2: 127, 1963.Google Scholar
5. Young, F. W. Jr., Sherrill, F. A., and Wittels, M. C., “Observation of Dislocations in Copper Using Borrmann Transmission Topographs,” J. Appl. Phys. (in press).Google Scholar
6. Lang, A. R., “Studies of Individual Dislocations in Crystals by X-Ray Diffraction Microradiography,” J. Appl. Phys. 30: 174-8, 1959.Google Scholar
7. Noggle, T. S., Day, B. F., Sherrill, F. A., and Young, F. W. Jr., “Stereo Images from Borrmann X-Ray Topographs of Copper Crystals” Bull. Am. Phys. Soc. 10: 324, 1965.Google Scholar
8. Haruta, K., “New Method of Obtaining Stereoscopic Pairs of X-Ray Diffraction Topographs,” J. Appl. Phys. 36: 1789, 1965.Google Scholar
9. Batterman, B. W. and Cole, H., “Dynamical Diffraction of X-Rays by Perfect Crystals,” Rev. Mod. Phys. 36: 681, 1964.Google Scholar
10. James, R. W., “The Dynamical Theory of X-Ray Diffraction,” in: F. Seitz and D. Tumbull, Solid State Physics, Vol. 15, Academic Press Inc., New York, 1963, p. 55.Google Scholar
11. Young, F. W. Jr. and Savage, J. R., “Growth of Copper Crystals of Low Dislocation Density,” J. Appl. Phys. 35: 1917, 1964.Google Scholar
12. Lang, A. R. and Polcarova, M., “X-Ray Topographic Studies of Dislocations in Iron Silicon Alloy Single Crystals,” Proc. Roy. Soc. (London) Ser. A 285: 297, 1965.Google Scholar
13. Wittels, M. C., Sherrill, F. A., and Kimbrough, A. C., “A Vertically Rotating Double-Crystal X-Ray Spectrometer,” in: W. M. Mueller, G. Mallett, and M. Fay, Advances in X-Ray Analysis, Vol. 7, Plenum Press, New York, 1964, p. 265.Google Scholar
14. Bonse, U., “X-Ray Picture of the Field of Lattice Distortions Around Single Dislocations,” in: J. B. Newkirk and J. H. Wernick, Direct Observation of imperfections in Crystals, Interscience Publishers, Inc., New York, 1962, p. 431.Google Scholar
15. Friedel, J., Dislocations, Pergamon Press, Oxford, 1964, p. 20.Google Scholar