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The Characterisation of Microtexture by Orientation Mapping

Published online by Cambridge University Press:  06 March 2019

R.A. Schwarzer ,
S. Zaefferer  and
K. Kunze
R.A. Schwarzer
Affiliation:
Institut für Metallkunde und Metallphysik D-38678 Clausthal-Z., Germany
S. Zaefferer
Affiliation:
Institut für Metallkunde und Metallphysik D-38678 Clausthal-Z., Germany
K. Kunze
Affiliation:
Institut für Metallkunde und Metallphysik D-38678 Clausthal-Z., Germany
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Extract

For a complete description of a material's microstructure the morphology as well as the distributions of chemical elements and of crystal lattice orientations must be known. While morphology is a standard issue of electron microscopy, and element distributions can be mapped readily using an EDX appliance, crystal lattice orientations in the bulk surface are accessible in routine work only recently [1, 2]. Backscatter Kikuchi patterns (BKP), also termed electron backscattering patterns (EBSP), are widely used for the determination of individual grain orientations in the surface of bulk polycrystals.

Information

Type
VII. Microbeam XRD and XRS Analysis
Information
Advances in X-Ray Analysis , Volume 38: Forty-third Annual Conference on Applications of X-ray Analysis , 1994 , pp. 547 - 550
Copyright
Copyright © International Centre for Diffraction Data 1994

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References

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