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The Effects of Using Long Soller Slits as “Parallel Beam Optics” for Gixrd on Diffraction Data

Published online by Cambridge University Press:  06 March 2019

Michael O. Eatough and
Raymond P. Gochner
Michael O. Eatough
Affiliation:
Chemical and X-ray Analysis Department 1824 Sandia National Laboratories, Albuquerque, NM 87185
Raymond P. Gochner
Affiliation:
Chemical and X-ray Analysis Department 1824 Sandia National Laboratories, Albuquerque, NM 87185
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Abstract

Grazing incidence x-ray diffraction (GIXRD) using long soller slit assemblies and a flat crystal monochromator, sometimes referred to as thin film optics, are used to study poly crystal line thin films, polymers, metals, etc. The unique ability of GIXRD to characterize crystalline materials as function of depth and provide accurate strain measurements has lead to the growing popularity of this technique. This non-focusing pseudo-parallel beam geometry can produce various effects on diffraction data which can make interpretation difficult Artifacts such as peak splitting, kα2 distortion, and peaks which shift dramatically as a function of grazing incidence angle are observed when using GIXRD. These artifacts can be related to grazing incidence angle, the divergence of the soller plates, the thickness of the soller plates, the substrate material, and the type of monochromator used. This paper briefly describes some of the topics discussed at the 1992 & 1993 Denver Conferences workshops on parallel beam optics.

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Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993, pp. 167 - 173
Copyright
Copyright © International Centre for Diffraction Data 1993

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