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Energy Dispersive X-ray Fluorescence Analysis Using Synchroton Radiation

Published online by Cambridge University Press:  06 March 2019

Atsuo Iida,
Yohichi Gohshi and
Tadashi Matsushita
Atsuo Iida
Affiliation:
Department of Industrial Chemistry, University of Tokyo, Hongo Bunkyo-ku Tokyo 113 Japan
Yohichi Gohshi
Affiliation:
Department of Industrial Chemistry, University of Tokyo, Hongo Bunkyo-ku Tokyo 113 Japan
Tadashi Matsushita
Affiliation:
Photon Factory, National Laboratory for High Energy Physics Oho-machi, Tsukubagun Ibaraki 305, Japan
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Abstract

Trace element analyses by energy dispersive X-ray fluorescence measurements were made using synchrotron radiation from a dedicated electron storage ring at the Photon Factory in Japan. The continuum or the monochromatic beam was used for excitation. A crystal monochromator or two types of mirror systems were used for monochromatic excitation. A high signal to background ratio was attained with the crystal monochromator, while the highest absolute detectability was achieved with the mirror system. The minimum detection limita obtained from thin samples are of the order of 0.1 ppm or less than 0.1 pg. Furthermore the signal to background ratio was significantly improved by using an X-ray mirror as a sample support in which, external total reflection of exciting X-rays occured.

Information

Type
III. New Techniques and Instrumentation in XRF
Information
Advances in X-Ray Analysis , Volume 28: Thirty-Third Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1984 , 1984, pp. 61 - 68
Copyright
Copyright © International Centre for Diffraction Data 1984

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References

1. Sparks, C. J. Jr., X-Ray Fluorescence Microprobe for Chemical Anlysis, in: “Synchrotron Radiation Research,” Winick, H., and Doniach, S., eds., Plenum Press, New York (1980)Google Scholar
2. Gilfrich, J. V., Skelton, E. F., Odari, S. B., Kirkland, J. P., and Nagel, D.J., Synchrotron Radiation X-ray Fluorescence Analysis, Anal. Chem., 55:187 (1983)Google Scholar
3. Knoechel, A., Petersen, W., and Tolkiehn, G., X-Ray Fluorescence Analysis with Synchrotron Radiation, Nucl. Instr. and Methods, 208:659 (1983)Google Scholar
4. Iida, A., Sakurai, K., Matsushita, T., and Gohshi, Y., Energy Dispersive X-ray Fluorescence Analysis using Synchrotron Radiation, to be published in Nucl. Instr. and MethodsGoogle Scholar
5. Jones, K. W., Gordon, B. M., Hanson, A. L., Hastings, J. B., Howells, M. R., Kraner, H. W., and Chen, J.R., Application of Synchrotron Radiation to Elemental Analysis, Nucl. Instr. and Methods, B3:225 (1984)Google Scholar
6. Bos, A. J. J., Vis, R. D., Verfuel, H., Prins, M., Davies, S. T., Bowen, D. K., Makjanic, J., and Valkomic, V., Experimental Comparison of Synchrotron Radiation with Other Modes of Excitation of X-Rays for Trace Element Analysis, Nucl. Instr. and Methods, B3:232 (1984)Google Scholar
7. Gordon, B. M., Sensitivity Calculation for Multielemental Trace Analysis by Synchrotron Radiation induced X-Ray Fluorescence, Nucl. Instr. and Methods, 204:223 (1982)Google Scholar
8. Lairson, B. M., and Bilderback, D.H., Transmission X-Ray Mirror - A New Optical Element, Nucl. Instr. and Methods, 195:79 (1982)Google Scholar
9. Yoneda, Y., and Horiuchi, T., Optical Flats for Use in X-Ray Spectrochemical Microanalysis, Rev. Sci. Instr., 42:1069 (1971)Google Scholar
10. Wobrauschek, P., and Aiginger, H., X-Ray Fluorescence Analysis in the ng Region Using Total Reflection of the Primary Beam, Spectrochimica Acta., 35B:607 (1980)Google Scholar