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Evaluation of Reference X-ray Diffraction Patterns in the ICDD Powder Diffraction File

Published online by Cambridge University Press:  06 March 2019

G. J. McCarthy,
J. M. Holzer,
W. M. Syvinski,
K. J. Martin and
R. G. Garvey
G. J. McCarthy
Affiliation:
Department of Chemistry North Dakota State University Fargo, North Dakota, 58105 USA
J. M. Holzer
Affiliation:
Department of Chemistry North Dakota State University Fargo, North Dakota, 58105 USA
W. M. Syvinski
Affiliation:
Department of Chemistry North Dakota State University Fargo, North Dakota, 58105 USA
K. J. Martin
Affiliation:
Department of Chemistry North Dakota State University Fargo, North Dakota, 58105 USA
R. G. Garvey
Affiliation:
Department of Chemistry North Dakota State University Fargo, North Dakota, 58105 USA
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Abstract

Procedures and tools for evaluation of reference x-ray powder patterns in the JCPDSICDD Powder Diffraction File are illustrated by a review of air-stable binary oxides. The reference patterns are evaluated using an available microcomputer version of the NBS*A1DS83 editorial program and PDF patterns retrieved directly from the CD-ROM in the program's input format. The patterns are compared to calculated and experimental diffractograms. The majority of the oxide patterns have been found to be in good agreement with the calculated and observed diffractograms, but are often missing some weak reflections routinely observed with a modern diffractometer. These weak reflections are added to the PDF pattern. For the remainder of the phases, patterns are redetermined.

Information

Type
VIII. Qualitative and Quantiative Phase Analysis by XRD
Information
Advances in X-Ray Analysis , Volume 34: Thirty-Ninth Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1990 , 1990, pp. 369 - 376
Copyright
Copyright © International Centre for Diffraction Data 1990

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References

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