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Evolution of X-Ray Instrumentation & Techniques, 1970-1990

Published online by Cambridge University Press:  06 March 2019

Ron Jenkins
Ron Jenkins*
Affiliation:
International Centre for Diffraction Date Newtown Square, PA, USA
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Abstract

While both X-ray Fluorescence Analysis and X-ray Powder Diffractometryhave their roots back in the earlier half of this century it wasn't until the 1960s that the two techniques became widely accepted. The growth in the application of X-ray methods for materials analysis grew rapidly between 1960 and 1970, then gained another major leap forward in the early ‘70s with the introduction of mincomputers. The introduction of Si(Li) detectors in the late’ 60s and early ‘70s added a further dimension to the available instrumentation. This paper reviews the growth in the field of X-ray materials analysis and highlights the major mile-stones in intrumentation and techniques.

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Type
Research Article
Information
Advances in X-Ray Analysis , Volume 39: Forty-Fourth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1995 , 1995, pp. 13 - 18
Copyright
Copyright © International Centre for Diffraction Data 1995

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