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Experimental Evaluation of Peak Height Approximation for X-Ray Diffracted Integrated Intensity Method

Published online by Cambridge University Press:  06 March 2019

Charles P. Gazzara
Charles P. Gazzara*
Affiliation:
Army Materials and Mechanics Research Center, Watertown, Massachusetts 02172, DRXMR-EM
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The mathematical description of an X-ray peak, diffracted from a powder or polycrystalline material, using physically meaningful parameters has been of interest for many years. With the popularity of computers, this need to characterize a diffraction peak has intensified.

A key problem which persists is how to describe the instrumental diffracted profile and therefore the observed diffracted characteristic peak with subsequent combinations of Kα doublets and mixed overlapping peaks. Many attempts have been made at finding a “true“ function to fit the observed diffracted peak; however, a practical solution has yet to be found.

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Type
Research Article
Information
Advances in X-Ray Analysis , Volume 24: Twenty-Ninth Annual Conference on Applications of X-ray Analysis, August 4-8, 1980 , 1980, pp. 277 - 282
Copyright
Copyright © International Centre for Diffraction Data 1980

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References

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