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Microstructoral and Chemical Analysis Using Electron Beams: The Analytical Electron Microscope

Published online by Cambridge University Press:  06 March 2019

A. D. Romig Jr.
A. D. Romig Jr.*
Affiliation:
Sandia National Laboratories Albuquerque, NM 87185
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Extract

This plenary paper is intended to be an introduction to the capabilities and limitations of analytical electron microscopy (AEM). The description to be given assumes no prior knowledge of AEM or any other electron microscopy, scanning or transmission. However, a basic understanding of x-ray generation and detection will be assumed.

Information

Type
I. Microbeam Techniques and Imaging Methods for Materials Characterization
Information
Advances in X-Ray Analysis , Volume 31: Thirty-Sixth Annual Conference on Applications of X-ray Analysis, August 3-7, 1987 , 1987 , pp. 9 - 24
Copyright
Copyright © International Centre for Diffraction Data 1987

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References

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