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New Standard Reference Materials for X-Ray Powder Diffraction*

Published online by Cambridge University Press:  06 March 2019

Camden R. Hubbard
Camden R. Hubbard*
Affiliation:
Center for Materials Science, National Bureau of Standards, Washington, D.C. 20234
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Standard Reference Materials (SRMs) from the National Bureau of Standards are samples or artifacts certified for one or more particular parameters. The NBS has produced SRHs since 1905 to aid commerce, to improve measurement technology and to assist in the enforcement of regulations. Today nearly 900 different SRHs are available to serve major segments of industry such as ferrous metals, nonferrous metals, mining, glass, primary chemicals, computer, nuclear power and electronics. In addition to the industrial customers, major SRM users include both federal and state governments, universities and nonprofit research organizations.

Information

Type
I. Accuracy in X-Ray Powder Diffraction
Information
Advances in X-Ray Analysis , Volume 26: Thirty-First Annual Conference on Applications of X-ray Analysis, August 1-6, 1982 , 1982 , pp. 45 - 51
Copyright
Copyright © International Centre for Diffraction Data 1982

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Footnotes

*

Contribution of the National Bureau of Standards. Not subject to copyright.

References

Hicho, G.E. and Eaton, E.E. (1983). Preparation and Characterization of Standard Reference Materials to be Used in the Determination of Retained Austenite in Hardened Steels. Adv. X-Ray Analy. 26.Google Scholar
Hubbard, C.R. (1982a). Certification of Si Powder Diffraction Standard Reference Material 640a. Appl. Cryst. (to be published)Google Scholar
Hubbard, C.R. (1982b). Fluorophlogopite-Low 20/Large d-spacing Powder Diffraction Standard Refence Material 675. (Submitted for publication)Google Scholar
Hubbard, C.R., Evans, E.H. and Smith, D.K. (1976). The Reference Intensity Ratio, I/Ic, for Computer Simulated Powder Patterns, X Appl. Cryst. 9:169–2.Google Scholar
Hubbard, C.R. and Smith, D. K. (1977). Experimental and Calculated Standards for Quantitative Analysis by Powder Diffraction. Adv. X-Ray Analy. 20:27–39.Google Scholar
Hubbard, C.R., Swanson, H.E. and Mauer, F.A. (1975). A Silicon Powder Diffraction Standard Reference Material. Appl. Cryst. 8:45–48.Google Scholar
Jenkins, R. and Hubbard, C.R. (1979). A Preliminary Report on the Design and Results of the Second Round Robin to Evaluate Search/Match Methods for Qualitative Powder Diffraction. Adv. X-Ray Analy. 22:133–2.Google Scholar
Pyrros, N.P. and Hubbard, C.R. (1982). Rational Functions as Profiles in Powder Diffraction. Appl. Cryst. (Submitted for publication)Google Scholar
Smith, D.K. and Barrett, C.S. (1979). Special Handeling Problems in X-ray Diffraction. Adv. X-Ray Analy. 22:1–12.Google Scholar
Snyder, R.L., Hubbard, C.R. and Panagiotopoulos, N.C. (1982). A Second Generation Automated Powder Diffractometer Control System. Adv. X-Ray Analy. 25:245–2.Google Scholar
Swanson, H.E., McMurdie, H.F., Morris, M.C. and Evans, E.H. (1966). Standard X-Ray Diffraction Powder Patterns. NBS Monograp. 25-Section 4:3-4. National Bureau of Standards, Washington, D.C. 20234Google Scholar