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Qualitative Analysis of Complicated Mixtures by Profile Fitting X-Ray Diffractometer Patterns

Published online by Cambridge University Press:  06 March 2019

T. C. Huang  and
William Parrish
T. C. Huang
Affiliation:
IBM Research Laboratory, San Jose, California 95193
William Parrish
Affiliation:
IBM Research Laboratory, San Jose, California 95193
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Abstract

The analysis of mixtures of phases which produce complicated composite x-ray powder patterns is greatly facilitated by use of our profile fitting method and the technique of applying it is illustrated with a five-compound mixture. Profile fitting gave higher precision in the determination of the reflection angles and Intensities and resolved overlaps in a much shorter time than with other methods. If the reference standards are obtained with the same precision, a smaller error window width can b e used in the search/match procedure.

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Type
Research Article
Information
Advances in X-Ray Analysis , Volume 21: Twenty-Sixth Annual Conference on Applications of X-ray Analysis, August 3-5, 1977 , 1977 , pp. 275 - 288
Copyright
Copyright © International Centre for Diffraction Data 1977

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References

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