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A Review of X-Ray Diffraction Methods for Diffusion Studies

Published online by Cambridge University Press:  06 March 2019

J. A. Carpenter Jr. and
D. R. Tenney
J. A. Carpenter Jr.
Affiliation:
Physics Research, Chrysler Corporation, P.O. Box 1118 (CIMS 418-38-04), Detroit, Michigan 48231
D. R. Tenney
Affiliation:
Metallurgical Engineering, Virginia Polytechnic Institute and State University, Blacksburg, Virginia 24061
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Abstract

X-ray diffraction methods for studying solid-state diffusion are reviewed. Because of the lack of penetration, such methods are suited for diffusion zones spanning only a few microns. Most involve analyses of one, or more, (hkl) “band” of intensities spread in 2θ as a result of the corresponding lattice parameter spread associated with compositional inhomogeneities. Further, many are non-destructive, making it possible to follow the progression of diffusion with time in the same specimen.

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Type
Research Article
Information
Advances in X-Ray Analysis , Volume 17: Twenty-Second Annual Conference on Applications of X-ray Analysis, August 22-24, 1973 , 1973, pp. 395 - 415
Copyright
Copyright © International Centre for Diffraction Data 1973

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