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Scrip-Fortan IV Software for Quantitative XRD

Published online by Cambridge University Press:  06 March 2019

Edward R. Wong
Affiliation:
Sohio Research Center, 4440 Warrensville Center Road, Cleveland, Ohio 44128
John Yeko
Affiliation:
Sohio Research Center, 4440 Warrensville Center Road, Cleveland, Ohio 44128
Philip Engler
Affiliation:
Sohio Research Center, 4440 Warrensville Center Road, Cleveland, Ohio 44128
Richard A. Gerron
Affiliation:
Sohio Research Center, 4440 Warrensville Center Road, Cleveland, Ohio 44128
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X-ray diffraction is ideal for quantitative crystalline phase determination in solid mixtures. Each phase of the mixture will produce its characteristic lines independent of other phases that may or may not be present when diffracting an X-ray beam and will be “proportional” to the amount of the phase present.

Information

Type
III. Quantitative XRD Analysis
Copyright
Copyright © International Centre for Diffraction Data 1982

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