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Some Recent Work in Low Energy X-Ray and Electron Analysis

Published online by Cambridge University Press:  06 March 2019

Burton L. Henke and
Robert E. Lent
Burton L. Henke
Affiliation:
Department of Physics and Astronomy, University of Hawaii
Robert E. Lent
Affiliation:
Department of Physics and Astronomy, University of Hawaii
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Abstract

Research is being conducted on low energy x-ray and electron physics and application in the 100-1000 eV region. Work on the optimization of fluorescence analysis for light elements, including the development of efficient dispersive systems as the multilayer analysers of the Langmuir-Blodgett type, has been continued. Along with the ultrasoft x-ray program has been one on photoelectron and Auger electron spectroscopy. An evaluation of the application of low energy electron spectroscopy for surface characterization is being made.

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Type
Research Article
Information
Advances in X-Ray Analysis , Volume 12: Seventeenth Annual Conference on Applications of X-ray Analysis, August 21-23, 1968 , 1968, pp. 480 - 495
Copyright
Copyright © International Centre for Diffraction Data 1968

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References

1. Henke, B. L., Elgin, R. L., Lent, R. E. and Ledingham, R. B., “X-Ray Absorption in the 2 to 200 A Region,” Technical Report, AFOSR 67-1254, June, 1967.Google Scholar
2. Henke, B. L., Elgin, R. L., Lent, R. E. and Ledingham, R. B., “X-Ray Absorption in the 2 to 200 A Region,” Norelco Reporter XIV, Number 3-4, 1967, p. 112.Google Scholar
3. Henke, B. L., “Techniques of Low Energy X-Ray and Electron Physics for the 50 to 1000 eV Region,” Proceedings of the Second Symposium of Low Energy X-Ray and Gamma Sources and Applications, Austin, Texas, 1967, p. 522.Google Scholar
4. Henke, B. L., “Techniques of Low Energy X-Ray and Electron Physics 50 to 1000 eV Region,” Horelco Reporter XIV, Number 3-4, 1967, p. 75.Google Scholar
5. Henke, B. L., “Application of Multilayer Analysers to 15 to 150 Angstrom Fluorescence Spectroscopy for Chemical and Valence Band Analysis,” Advances in X-Ray Analysis, Vol. 9, Plenum Press, New York, 1965, p. 430.Google Scholar
6. Fischer, D. W. and Baun, W. L., “Band Structure and the Titanium LII m X-Ray Emission and Absorption Spectra from Pure Metal, Oxides, Nitride, Carbide and Boride,” J. Appl. Phys. (in press).Google Scholar
7. Holliday, J. E., “The Use of Soft X-Ray Fine Structure in Bonding Determination and Light Element Analysis,” Horelco Reporter XIV, Number 3-4, 1967, p. 84.Google Scholar
8. Henke, B. L., “X-Ray Fluorescence Analysis for Sodium, Fluorine, Oxygen, Hitrogen, Carbon, and Boron,” Advances in X-Ray Analysis, Vol. 7, Plenum Press, New York, 1961, p. 460.Google Scholar
9. Harris, L. A., Advances in X-Ray Analysis, Vol. II (in press).Google Scholar
10. Henke, B. L., “Microanalysis with Ultrasoft X-Radions,” Advances in X-Ray Analysis, Vol. 5 Plenum Press, New York, 1961, p. 285.Google Scholar
11. Birkhoff, R. D., “Hie Passage of Fast Electrons Through Matter,” Handbuch der Fhysik, Vol. XXXIV, Springer-Verlag, Berlin, 1958, p. 53.Google Scholar
12. Pines, D., “Collective Energy Losses in Solids,” Rev. Mod. Phys., Vol. 28, Number 3, July, 1956, p. 184.Google Scholar