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Twenty Years of Progress in X-Ray Diffraction Techniques

Published online by Cambridge University Press:  06 March 2019

Andre Guinier
Andre Guinier*
Affiliation:
University of Paris, Paris, France
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Abstract

Although no revolutionary advance has been achieved in the last two decades, X-ray diffraction is not to be considered as a quiescent field of physics. Actually many improvements, in theory as well as in experiment, slight by themselves but very numerous, have considerably increased the efficiency of techniques such as the determination of crystal structures, the analysis of crystalline phases, and the applications of X-rays to various problems of the physics of solids. Only the two last points will be dealt with here:

  1. 1. Crystalline phase analysis. The development of a satisfactory atlas of powder patterns has been too slow, and the data are not yet complete and precise enough to permit a rational utilization of the modern diffractometers. A very interesting new approach is the systematic indexing of the powder patterns which would be possible with computers. In the near future, anyone should be able to analyze a powder at any temperature as an easy routine experiment.

  2. 2. The study of lattice defects. X-ray techniques are now in competition with electron microscopy, the development of which has been very successful in recent years. Now we have a better understanding of the possibilities of both techniques. X-rays give better results to determine the statistics of an extended disorder even if it is slight (e.g., degrees of order in a solid solution), and the microscope is more powerful for the detection of large but rare defects (e.g., dislocations).

Information

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 5: Tenth Annual Conference on Applications of X-ray Analysis, August 7-9, 1961 , 1961, pp. 1 - 12
Copyright
Copyright © International Centre for Diffraction Data 1961

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References

1. Henry, N. F., Lipson, H., and Wooster, W. A., The Interpretation of X-Ray Diffraction Photographs, MacMilian and Co., London, 1953.Google Scholar
2. Hesse, R., Acta Cryst., Vol. 1, 1948, p. 200.Google Scholar
3. Ito, T., X-Ray Studies on Polymorphism, Maruzen Co., Ltd., Tokyo, 1950.Google Scholar
4. de Wolff, P. M., Acta Cryst., Vol. 11, 1958, p. 664.Google Scholar
5. Koene, A. A., Report No. 308, Numerical Section of the Statistics Department T.N.O., The Hague, Netherlands, 1960.Google Scholar
6.International Tables of Crystallography, Vol. I, Kynoch Press, Birmingham, 1952, p. 530.Google Scholar
7. James, R. W., The Crystalline State, Vol. II, Bell and Sons, Ltd., London, 1948.Google Scholar
8. Warren, B. E., X-Ray Studies of Deformed Metals, Vol. 8, Progress in Metal Physics, Pergamon Press, London, 1959.Google Scholar
9. Barrett, C. S., Trans. AIME, Vol, 188, 1950, p. 123.Google Scholar
10. Guinier, A., “Heterogeneities in Solid Solutions,” Vol, IX, Solid State Physics, Academic Press, New York, 1959.Google Scholar
11. Keller, A., J. Polym. Sci., Vol. 15, 1955, p. 31; Vol. 17, 1955, p. 447; Phil. Mag., Vol. 2, 1957, p. 1171; Makromol, Chem., Vol. 34, 1959, p, 1.Google Scholar
12. Thomas, G. and Nutting, J., J. Inst. Metals, Vol. 88, pt. 2, October, 1959, pp. 81–90.Google Scholar