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The Use of Multi-scan Diffraction in Phase Identification

Published online by Cambridge University Press:  06 March 2019

Gordon S. Smith and
M. C. Nichols
Gordon S. Smith
Affiliation:
Chemistry Department, Lawrence Livermore National Laboratory, Livermore, CA 94550; Materials Science Department, Sandia, National Laboratory, Livermore, CA 94550
M. C. Nichols
Affiliation:
Chemistry Department, Lawrence Livermore National Laboratory, Livermore, CA 94550; Materials Science Department, Sandia, National Laboratory, Livermore, CA 94550
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Abstract

Phase identification by X-ray diffraction techniques in a complex mixture would be greatly simplified if the component phases could be physically separated. As opposed to current computer search-match algorithms for phase identification, which presuppose a single diffraction scan on a carefully prepared sample, we propose multi-scan data-taking on a not-so-carefully prepared sample so as to exploit certain aberrations in the diffracted intensities. The result can effectively be a physical separation by diffraction. Examples include exploitation of samples having a preferentially oriented component as well as samples with components having differing crystallite sizes. The techniques can involve diffractometer as well as film techniques.

Information

Type
IV. XRD Applications and Automation
Information
Advances in X-Ray Analysis , Volume 26: Thirty-First Annual Conference on Applications of X-ray Analysis, August 1-6, 1982 , 1982, pp. 189 - 196
Copyright
Copyright © International Centre for Diffraction Data 1982

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References

Frevel, L. K., 1982, Structure-Sensitive Search-Match Procedure for Powder Diffraction, Anal. Chem., 54, p. 691–697 Google Scholar
Nichols, M. C. and Johnson, Quintin, 1980, The Search-Match Problem, in:“Advances In X-ray Analysis”, Plenum Press, NY, Vol 23, p. 273 Google Scholar
Nichols, M. C., Smith, D. K. and Johnson, Quintin, 1982, Differential X-ray Diffraction by Wavelength Variation:A Theoretical Basis, Submitted to J.:Appl. Cryst.Google Scholar
Parrish, W. and Huang, T. C., 1982, Accuracy and Precision in X-ray Polycrystalline Diffraction, in:“Advances In X-ray Analysis’. Plenum Press, NY, Vol 25.Google Scholar