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A Vertically Rotating Double-Crystal X-Ray Spectrometer

Published online by Cambridge University Press:  06 March 2019

M. C. Wittels,
F. A. Sherrill and
A. C. Kimbrough
M. C. Wittels
Affiliation:
Oak Ridge National Laboratory, * Oak Ridge, Tennessee
F. A. Sherrill
Affiliation:
Oak Ridge National Laboratory, * Oak Ridge, Tennessee
A. C. Kimbrough
Affiliation:
Oak Ridge National Laboratory, * Oak Ridge, Tennessee
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Abstract

A versatile double-crystal X-ray spectrometer has been developed for the precise measurement of X-ray diffraction line widths to tenths of seconds. The device can be employed in either the parallel or antiparallel arrangement for rocking curve studies and can also be used in anomalous X-ray transmission experiments with nearly perfect crystals.

A detailed description of the instrument is given as well as some results concerning the Darwin theory of X-ray diffraction line widths and Borrmann effects.

Information

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 7: Twelfth Annual Conference on Applications of X-ray Analysis, August 7-9, 1963 , 1963, pp. 265 - 280
Copyright
Copyright © International Centre for Diffraction Data 1963

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