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Accurate Measurement of Trace Elements Using an Innovative Fixed Goniometer for a Simultaneous Spectrometer

Published online by Cambridge University Press:  06 March 2019

K. Kansai,
K. Toda,
H. Kohno,
T. Arai and
R. Wilson
K. Kansai
Affiliation:
Rigaku Industrial Corporation Osaka, Japan
K. Toda
Affiliation:
Rigaku Industrial Corporation Osaka, Japan
H. Kohno
Affiliation:
Rigaku Industrial Corporation Osaka, Japan
T. Arai
Affiliation:
Rigaku Industrial Corporation Osaka, Japan
R. Wilson
Affiliation:
Rigaku/USA, Inc. Danvers, MA
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Extract

Advancements in trace clement analysis require improvements in both the signal-to-noise ratio and accurate background correction. With a sequential spectrometer, one can obtain detection limits of around 0.1 ppm for medium to heavy Z elements. Conditions can be individually optimized for each element, for example, selection of filters, collimators, crystals and background subtraction. The disadvantage is that the analysis time may become “long” if many elements are to be analyzed. This long exposure time can lead to the deterioration of some samples.

Information

Type
IX. XRS Mathematical Methods, Trace Analysis and Other Applications
Information
Advances in X-Ray Analysis , Volume 38: Forty-third Annual Conference on Applications of X-ray Analysis , 1994, pp. 691 - 698
Copyright
Copyright © International Centre for Diffraction Data 1994

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References

1. Arai, T., “Inte.ns.ity and Distribution of Background X-rays in Wavelength-Dispersive Spectrometry,” X-ray Spectrometry, vol 20, p. 9 1991.Google Scholar
2. Yamada, K., Kohno, H. and Arai, T., “Measurements of Low Concentration Components in Iron Ores Using Fusion Method,” Advances in X-Ray Analysis, vol. 35, p. 1147 1992.Google Scholar