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Alignment Device and Thermal-Control System for High-Temperature X-Ray Diffractometry

Published online by Cambridge University Press:  06 March 2019

I. Corvin,
F. Schossberger and
F. Ticulka
I. Corvin
Affiliation:
Armour Research Foundation of Illinois Institute of Technology, Chicago, Illinois
F. Schossberger
Affiliation:
Armour Research Foundation of Illinois Institute of Technology, Chicago, Illinois
F. Ticulka
Affiliation:
Armour Research Foundation of Illinois Institute of Technology, Chicago, Illinois
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Abstract

A high-temperature high-vacuum X-ray diffractometer attachment was constructed to observe formation of materials at elevated temperatures. The device consists of a conventional water-cooled compartment, a resistance-type furnace for heating samples to 800°C, and inlets and outlets for gaseous reactants and evacuation. Two sources are available for evaporation of materials which may react with or coat the sample. The sample is aligned by a two-part sample-slit system. The sample temperature is regulated by means of a current-adjusting control unit and a self-saturating reactor with suitably positioned thermocouples. Temperature distribution and constancy over the sample surface were determined.

Information

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 5: Tenth Annual Conference on Applications of X-ray Analysis, August 7-9, 1961 , 1961, pp. 221 - 228
Copyright
Copyright © International Centre for Diffraction Data 1961

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