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Appearance Potential X-Ray Fluorescence Analysis

Published online by Cambridge University Press:  06 March 2019

J. P. Kirkland,
J. V. Gilfrich and
W. T. Elam
J. P. Kirkland
Affiliation:
Condensed Matter Physics Branch Naval Research Laboratory Washington, DC 2C375-5000
J. V. Gilfrich
Affiliation:
Condensed Matter Physics Branch Naval Research Laboratory Washington, DC 2C375-5000
W. T. Elam
Affiliation:
Condensed Matter Physics Branch Naval Research Laboratory Washington, DC 2C375-5000
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Summary

Appearance potential spectroscopy has been practiced for many years. In essence, it simply involves ramping the energy of the exciting quanta across excitation edges and observing the onset of a signal. Because of the relative simplicity with which the energy can be controlled, electrons have been the conventional quanta employed. The signals which have "appeared", characteristic of the atoms being studied, have been either Auger electrons or x-ray. The literature is replete with references to appearance potential measurements; the applications have, for the most part, demonstrated interesting physics, but analytical measurements have not been numerous.

Information

Type
VIII. Synchrotron Radiation and Other Applications of XRF
Information
Advances in X-Ray Analysis , Volume 31: Thirty-Sixth Annual Conference on Applications of X-ray Analysis, August 3-7, 1987 , 1987, pp. 479 - 486
Copyright
Copyright © International Centre for Diffraction Data 1987

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References

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