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Automated Quantitative XRF Analysis Software in Quality Control Applications

Published online by Cambridge University Press:  06 March 2019

Anthony J. Klimasara
Anthony J. Klimasara*
Affiliation:
GTE Electrical Products Technical Assistance Laboratory Danvers, MA 01923
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Abstract

A menu-driven IBM-PC/MS-DOS software system for quantitative XRF analysis was designed combining elements of pattern recognition (spectral “fingerprinting”) with mathematical correction models. The following topics are covered:

  1. - pattern recognition method; N - dimension representation

  2. - local empirical Lachance-Traill or Lucas-Tooth & Price models

  3. - EGA/VGA intelligent driver for a calibration display

  4. - dSASE III Plus “data files - accessed from dBXL/Quicksifver”, dBASE III Plus or from compiled BASIC equipped with “call subroutines”

  5. - Examples of applications (stainless steels and ceramics).

In this approach, experimental alphas are computed utilizing the closest automatically preselected standards from available data files. Alpha values generated in this fashion we term “local alphas”. An intelligent software program is employed which automatically recognizes the resolution of tiie CRT display and delivers the best possible display for the available equipment. This new design also permits the utilization of dBXL/Quicksitver, dBASE III Plus or compiled BASIC resources for additional on site system customization programming. A dBASE III Plus file format is used for XRF data storage. This permits fast data exchange with a local ASCII database and also with all popular spreadsheet formats. Additionally, there are utility subroutines available which allow direct and rapid manipuiation of dBASE III Plus files in compiled BASIC. Application of this software system and graphics to stainless steels and engineered ceramic materials are demonstrated. RIGAKU Smax/PDP-11/73 and TRACOR X-RAY SPECTRACE 5000/Compaq 386 spectrometers are used in these studies.

Information

Type
II. Quantitative Phase Analysis by X-Ray Diffraction (XRD)
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 111 - 116
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

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