Hostname: page-component-7b7567c8c-7pwfn Total loading time: 0 Render date: 2026-11-15T18:11:20.394Z Has data issue: false hasContentIssue false
  • English
  • Français

A Blazed-Grating Scanning Spectrometer for Ultrasoft X-Rays Suitable for Use in an Electron Microprobe

Published online by Cambridge University Press:  06 March 2019

J. B. Nicholson and
M. F. Hasler
J. B. Nicholson
Affiliation:
Hasler Research Center Applied, Research Laboratories, Inc. Goleta, California
M. F. Hasler
Affiliation:
Hasler Research Center Applied, Research Laboratories, Inc. Goleta, California
Get access

Abstract

The importance of operating within the blaze angle is emphasized by a series of measurements of ultrasoft X-rays obtained with a new grazing-incidence, grating spectrometer, A formula to maximize output intensity has been derived which predicts a variation of input angle with changes of wavelength. The spectrometer is designed to utilize this function. The grating spectrometer was installed into an Applied Research Laboratories Analyst's Microprobe. Since the AMX furnishes an utt.rasoft spectrometer with a fatty acid pseudocrystal as standard equipment, it is possible to compare the two systems simultaneously on the same sample at the same wavelength. The grating and crystal systems are compared for peak intensity and line-to-background ratio.

Information

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 9: Fourteenth Annual Conference on Applications of X-ray Analysis, August 25-27, 1965 , 1965, pp. 420 - 429
Copyright
Copyright © International Centre for Diffraction Data 1965

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1. Holliday, J., “Soft X-Ray Emission Spectroscopy in the 13 Å to 44 Å Region,” J. Appl. Phys. 33(11): 3259, 1962.Google Scholar
2. Nicholson, J. B. and Wittry, D. B., “A Comparison of the Performance of Gratings and Crystals in the 20-115 A Region,” in: W. M. Mueller, G. R. Mallett, and M. J. Fay (eds), Advances in X-Ray Analysis, Vol 7, Plenum Press, New York, 1964, pp. 497–511.Google Scholar
3. Nicholson, J. B., Mooney, C. F., and Griffin, G. L., “The Effect of Grating Blaze Angle on the Diffraction Efficiency of Ultra-Soft X-Ray Radiation,” in; W. M. Mueller, G. R. Mallett, and M. J. Fay (eds,), Advances in X-Ray Analysis, Vol. 8, Plenum Press, New York, 1965, pp. 301–314.Google Scholar
4. Henke, B. L. and Miller, J. C., “Ultra-Soft X-Ray Interaction Coefficients,” AFOSR TN-59-895, Physics Division Air Force Office of Scientific Research, Washington, D.C, 1959.Google Scholar
5. Lukirskii, A. P., Savinov, E. P., Ershov, O. A., and Shepelev, U. F., “Reflection Coefficients of Radiation in the Wavelength Range from 23.7 A to 113 A for a Number of Elements and Substances, and The Determination of the Refractive Index and Absorption Coefficient,” Opt. Spectry. USSR (English Transi.) 16(2): 314, 1964.Google Scholar
6. Wuerker, R., “Spectral Reflectance by Solids of Carbon K Radiation,” Ph.Thesis, D., Stanfoi'd University, Palo Alto, California, 1960.Google Scholar
7. Compton, A.H. and Allison, S., X-Rays in Theory and Experiment, second edition, D. Van Nostrand, New York, 1935.Google Scholar
8. Hasler, M. F. and Nicholson, J. B. (to be published).Google Scholar
9. Holliday, J., Handbook of X-Rays, McGraw-Hill, New York (to be published).Google Scholar