Hostname: page-component-7b7567c8c-2n9c9 Total loading time: 0 Render date: 2026-11-14T01:13:04.637Z Has data issue: false hasContentIssue false
  • English
  • Français

The Characteristic X-Rays from Boron and Beryllium

Published online by Cambridge University Press:  06 March 2019

R. C. Ehlert and
R. A. Mattson
R. C. Ehlert
Affiliation:
General Electric Company, Milwaukee, Wisconsin
R. A. Mattson
Affiliation:
General Electric Company, Milwaukee, Wisconsin
Get access

Abstract

Lead stearate and lead lignocerate multilayer soap-film structures are used to disperse the K emission lines of boron and beryllium respectively. Data are presented showing the dependence of the peak height and half-width on the number of layers in the lignocerate structure. Spectra are presented and compared for the pure element and several compounds of each element. Both electron and X-ray excitation are used. Detection is by a thin-window flow-proportional counter.

Information

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 9: Fourteenth Annual Conference on Applications of X-ray Analysis, August 25-27, 1965 , 1965, pp. 456 - 470
Copyright
Copyright © International Centre for Diffraction Data 1965

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1. Coster, D. and Hof, S., “On the Emission Spectra of Some Oxides and Pure Elements in the Soft X-Ray Region,” Physica 7: 655, 1940.Google Scholar
2. Crisp, R. S. and Williams, S. E., “Soft X-ray Emission Spectra of Sodium, Beryllium, Silicon, and Lithium,” Phil. Mag. 6: 365, 1961.Google Scholar
3. Fischer, D. W. and Baun, W. L., ‘'The Effect of Chemical Combination on Long Wavelength K and L X-Kay Spectra,” presented at 16th Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy, March, 1965.Google Scholar
4. Gwinner, E. and Kiessig, H., “The Influence of Binding Energy on the Boron K Lines,” Z. Physik. 107: 449, 1937.Google Scholar
5. Hautot, A. and Serpe, J., “On the K Emission Line of Boron,” J, Phys. radium 8: 175, 1937.Google Scholar
6. Skinner, H. W. B., “The Soft X-Ray Spectroscopy of Solids. I K- and i-Emission Spectra from Elements of the First Two Groups,” Phil. Trans. Roy. Soc. London Sur. A 239: 95, 1940.Google Scholar
7. Skinner, H. W. B., and Johnston, J. E., “Soft X-Ray Bands from Dilute Alloys,” Proc-Cambridge Phil. Soc. 34: 109, 1938.Google Scholar
8. Mattson, R. A., “Some Measurements of Carbon K Excitation in a New Ultrasoft X-Ray Spectrometer,” Advances in X-Ray Analysis, Vol. 8, p. 333, University of Denver, Plenum Press, New York, 1965.Google Scholar
9. Ehlert, R. C., “The Diffraction of X-Rays by Multilayer Stéarate Soap Films,” in: W. M. Mueller, G. R. Mallett, and M. J. Fay (eds.), Advances in X-Ray Analysis, Vol. 8, Plenum Press, New York, 1965, p. 325.Google Scholar
10. Ehlert, R. C., “Overturning of Monolayers,” J. Colloid Sci. 20: (4) 387, 1965.Google Scholar