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A Combined Fundamental Alphas/Curve Fitting Algorithm for Routine XRF Sample Analysis

Published online by Cambridge University Press:  06 March 2019

Dennis J. Kalnicky
Dennis J. Kalnicky*
Affiliation:
Princeton Gamma-Tech 1200 State Road Princeton, NJ 08540
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Abstract

Analysis of sample composition and/or thickness in a routine, process-control or monitoring environment generally requires rapid turn-around time with minimal sample handling. X-ray Fluorescence (XRF) is well-suited for these kinds of analyses and has been applied to various bulk and thin sample applications (1-7). This technique is rapid, precise, non-destructive, and requires minimal sample handling.

X-ray Fluorescence is generally considered a secondary analysis technique, that is, instrumentation must be calibrated using known standards before unknown samples may be analyzed (quantitative analysis). Continuing work on standardless approaches, particularly for Energy-Dispersive XRF (EOXRF) systems, relax this requirement for some samples but the large share of XRF analyses still require calibration with standards. A number of mathematical and non-matheraatical techniques have been devised to calibrate XRF measurements for many different sample types (1,2,8,9).

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Type
Research Article
Information
Advances in X-Ray Analysis , Volume 29: Thirty-Fourth Annual Conference on Applications of X-ray Analysis, August 5-9, 1985 , 1985 , pp. 451 - 460
Copyright
Copyright © International Centre for Diffraction Data 1985

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References

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