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The Control and Processing of Data from an Automated X-Ray Powder Diffractometer

Published online by Cambridge University Press:  06 March 2019

Chester L. Mallory  and
Robert L. Snyder
Chester L. Mallory
Affiliation:
N.Y.S. College of Ceramics Alfred University, Alfred, NY 14802
Robert L. Snyder
Affiliation:
N.Y.S. College of Ceramics Alfred University, Alfred, NY 14802
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Abstract

A program system design which will facilitate the exchange of automated diffractometer control programs is presented. The various procedures for collecting data and finding peaks, not involving profile fitting, were programmed, tested and evaluated. The optimum strategy evolving from this work involves a decision making algorithim which locates and removes the experimental threshold from the digital diffraction data, removes the Kα2 component, smooths and locates diffraction peaks via a second derivative procedure.

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Type
Research Article
Information
Advances in X-Ray Analysis , Volume 22: Twenty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-4, 1978 , 1978 , pp. 121 - 131
Copyright
Copyright © International Centre for Diffraction Data 1978

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References

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