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Dynamic Characterization in Advanced Manufacturing

Published online by Cambridge University Press:  06 March 2019

Robert L. Snyder and
Bin-Jiang Chen
Robert L. Snyder
Affiliation:
Institute of Ceramic Superconductivity NYS College of Ceramics, Alfred University Alfred, NY 14802
Bin-Jiang Chen
Affiliation:
Institute of Ceramic Superconductivity NYS College of Ceramics, Alfred University Alfred, NY 14802
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Abstract

The coming era of reduced defense funding will dramatically alter the way in which advanced materials develop. In the absence of large funding researchers must concentrate on reducing the time that the R&D of a new materia) consumes. One way in which speed may be achieved is via the development of very fast dynamic characterization procedures which can rapidly and intelligently monitor and optimize the formation of a desired microstructure. Another potential advantage to this approach is its ability to characterize the actual amount of material which goes into a final product; permitting a rapid transition from R&D to manufacturing by avoiding the problems associated with scale-up. Example high-temperature dynamic characterization procedures have been applied to the problem of trying to improve the current carrying capacity of the YBa 2 Cu 3 O 7-8 ceramic superconductor by melt-texturing. These procedures have led to a technique for the preparation of specimens with J c on the order of 10,000 A/cm2.

Information

Type
I. Dynamic Characterization of Materials by Powder Diffraction
Information
Advances in X-Ray Analysis , Volume 38: Forty-third Annual Conference on Applications of X-ray Analysis , 1994, pp. 1 - 8
Copyright
Copyright © International Centre for Diffraction Data 1994

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