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Fundamental-Parameters Calculations on a Laboratory Microcomputer

Published online by Cambridge University Press:  06 March 2019

J. W. Criss
J. W. Criss*
Affiliation:
Criss Software, Inc., 12204 Blaketon Street, Largo, Maryland 20870
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Fundamental-parameters calculations can be made on a laboratory microcomputer fo r automatic treatment of interelement absorption and enhancement effects in x-ray fluorescence analysis. A new software package, called XRF-11, uses an efficient combination of fundamental parameters and alpha factors to compensate for any lack of measured reference materials, while taking full advantage of whatever standards are available, even just pure elements. In many cases, one multi-element standard is enough for accurate analysis.

The new XRF-11 software uses the same data base of absorption coefficients, fluorescence yields, etc. as the big-computer program NRLXRF, and combines theory with experiment in a consis tent way that is similar to, but more efficient than, the treatment used in NRLXRF.

Information

Type
Mathematical Methods in XRF
Information
Advances in X-Ray Analysis , Volume 23: Twenty-Eighth Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1979 , 1979 , pp. 93 - 97
Copyright
Copyright © International Centre for Diffraction Data 1979

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References

1. Criss, J. W., “NRLXRF”, COSMIC Program and Documentation DOD-65, Computer Software Management and Information Center, University of Georgia, Athens Ga 30602 (1977 and updates)Google Scholar
2. Gillam, E. and Heal, H. T., Some Problems in the Analysis of Steels by X-Ray Fluorescence, Brit J Appl Phys, 3:353 (1952)Google Scholar
3. Compton, A. H., The Efficiency of Production of Fluorescent X-Rays, Phil Mag, 8:961 (1929)Google Scholar
4. Bearden, J. A., X-Ray Wavelengths, Rev Mod Phys 39:78 (1967)Google Scholar
5. Bearden, J. A. and Burr, A. F., Reevaluation of X-Ray Atomic Energy Levels, Rev Mod Phys, 39:125 (1967)Google Scholar
6. McMaster, W. H., del Grande, N. K., Mallet, J. H., Hubbell, J. H., “Compilation of X-Ray Cross Sections”, Lawrence Radiation Laboratory report UCRL-50174 sec II (1969 and revisions)Google Scholar
7. Bambynek, W., Crasemann, B., Fink, R. W., Freund, H. U., Mark, H., Swift, C. D., Price, R. E., Rao, P. V., X-Ray Fluorescence Yields, Auger, and Coster-Kronig Transition Probabilities, Rev Mod Phys 44:716 (1972)Google Scholar
8. Kramers, H. A., On the Theory of X-Ray Absorption and of the Continuous X-Ray Spectrum, Phil Mag 46:836 (1923)Google Scholar
9. Green, M. and Cosslett, V. E., The Efficiency of Production of Characteristic X-Radiation in Thick Targets of a Pure Element, Proc Phys Soc 78:1206 (1961)Google Scholar
10. Philibert, J., pp 379–392 in “X-Ray Optics and X-Ray Microanalysis”, Pattee, H. H., Cosslett, V. E., and Engstrom, A., eds, Academic Press, New York (1963)Google Scholar
11. J. Heinrich, K. F., “Present State of the Classical Theory of Quantitative Electron Probe Microanalysis”, Nat Bur Stand (U.S.) Tech Note 521 (1970)Google Scholar
12. Claisse, F. and Quintin, M., Can Spectrosc 12:129 (1967)Google Scholar
13. Criss, J. W., Birks, L. S., and Gilfrich, J. V., A Versatile X-Ray Analysis Program Combining Fundamental Parameters and Empirical Coefficients, Anal Chem 50:33 (1978)Google Scholar