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Low Temperature Attachment For X-Ray Powder Diffractometry

Published online by Cambridge University Press:  06 March 2019

H.W. King ,
M.A. Peters ,
E.A. Payzant  and
M.B. Stanley
H.W. King
Affiliation:
Department of Materials Engineering University of Western Ontario London, ON, N6A 5B9 Canada
M.A. Peters
Affiliation:
Department of Materials Engineering University of Western Ontario London, ON, N6A 5B9 Canada
E.A. Payzant
Affiliation:
Department of Materials Engineering University of Western Ontario London, ON, N6A 5B9 Canada
M.B. Stanley
Affiliation:
Department of Materials Engineering University of Western Ontario London, ON, N6A 5B9 Canada
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Abstract

A low temperature attachment based on a miniature open-cycle Joule-Thomson refrigerator has been developed for x-ray diffractometry measurements over the temperature range from 65 - 400 K, By use of a special mounting plate, the device can be substituted for the heater assembly of a high temperature attachment and thereby utilize the available vacuum chamber and x-ray transparent beryllium window. The device is demonstrated by investigating the polymorphic phase transformations that occur in barium titanate.

Information

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 457 - 463
Copyright
Copyright © International Centre for Diffraction Data 1993

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References

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