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Microanalysis with Ultrasoft X-Radiations*

Published online by Cambridge University Press:  06 March 2019

Burton L. Henke
Burton L. Henke*
Affiliation:
Pomona College, Claremont, California
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Abstract

The diffraction, reflection, absorption, fluorescence, and the electronic emission that results from the interaction with ultrasoft X-rays (λ > 10 A) are presented as practical bases for microanalysis. Recent developments on sources and detectors for the ultrasoft X-radiations are described. A preliminary report on a current investigation on low-energy photo-Auger electron analysis and on a new type of low-energy electron spectrometer is also presented.

Information

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 5: Tenth Annual Conference on Applications of X-ray Analysis, August 7-9, 1961 , 1961, pp. 285 - 305
Copyright
Copyright © International Centre for Diffraction Data 1961

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Footnotes

*

This work is supported by the U.S. Air Force Office of Scientific Research.

References

1. Henke, B. L., “Measurement in the 10 to 100 Angstrom X-Ray Region,” Advances in X-Ray Analysis, Vol. 4, 1961, University of Denver, Plenum Press, New York, pp. 224–279.Google Scholar
2. Henke, B. L. and DuMond, Jesse W. M., “Submicroscopic Structure Determination with Long Wavelength X-Ray Diffraction,” J. Appl. Phys., Vol. 26, 1955, pp. 903–917.Google Scholar
3. Henke, B. L. and Miller, J. C., “Ultrasoft X-Ray Interaction Coefficients,” Technical Report No, 3 - AFOSR TN 59-895, 1959.Google Scholar
4. Parrat, L. G., “Surface Studies of Solids by Total Reflection of X-Rays,” Phys, Rev., Vol. 95, 1954, pp. 359–369.Google Scholar
5. Henke, B. L., “X-Ray Microscopy” Encyclopaedia of Microscopy, G. L. Clark, Editor, Reinhold Publishing Co., New York, 1961, pp. 675–693.Google Scholar
6. Henke, B. L., White, R., and Lundberg, B., “Semiempirical Détermination of Mass Absorption Coefficients for the 5 to 50 Angstrom X-Ray Region,” J. Appl. Phys., Vol. 28, 1957, pp. 98–105.Google Scholar
7. Henke, B. L. and Baird, A. K., “Fluorescence Analysis for Na and Mg” (In preparation).Google Scholar
8. Henke, B. L., Campbell, J. P., and Greenhall, C. A., “Photo-Auger Electron Spectroscopyin the 10 to 1000 ev Region” (In preparation).Google Scholar
9. Henke, B. L., “Ultrasoft X-Ray Sources” (In preparation).Google Scholar
10. Henke, B. L., Poen, Ong Sing, and Gwyn, R. B., “Ultrasoft X-Ray Detectors” (In preparation).Google Scholar
11. Tomboullian, D. H., “The Experimental Methods of Soft X-Ray Spectroscopy and the Valence Band Spectra of the Light Elements,” in S. Flugge (ed.), Handbuch der Physik, Wringer-Verlag, Berlin, 1957, pp, 246–304.Google Scholar