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A New Approach to Quantitative Multielement X-Ray Fluorescence Analysis

Published online by Cambridge University Press:  06 March 2019

Frank H. Chung
Frank H. Chung*
Affiliation:
Sherwin-Williams Research Center Chicago, IL 60628
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Abstract

A quantitative X-ray fluorescence method for single or multielement analysis is reported. It requires no calibration curve and covers a wide concentration range. The sample is dispersed into a film-forming polymer solution from which a thin specimen is made. A simple intensity-concentration equation free from matrix factors is derived. The simplicity and versatility of this method are demonstrated with eighteen examples. The precision of this method is statistically estimated to be 5% relative.

Information

Type
Mathematical Correction Procedures for X-Ray Spectrochemical Analysis
Information
Advances in X-Ray Analysis , Volume 19: Twenty-Fourth Annual Conference on Applications of X-ray Analysis, August 6-8, 1975 , 1975, pp. 181 - 190
Copyright
Copyright © International Centre for Diffraction Data 1975

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References

1. Bertin, E. P., Principles and Practice of X-Ray Spectrometric Analysis, p. 425, Plenum Press, New York (1970).Google Scholar
2. Chung, F. H., Lentz, A. J. and Scott, R. W., “A Versatile Thin Film Method for Quantitative X-Ray Emission Analysis”, X-Ray Spectrometry, 3, 172 (1974).Google Scholar
3. Chung, F. H., “Quantitative Interpretation of X-Ray Diffraction Patterns of Mixtures, III. Simultaneous Determination of a Set of Reference Intensities”, J. Appl. Cryst. 8, 17 (1975).Google Scholar
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