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Nondispersive X-Ray Fluorescent Spectrometer

Published online by Cambridge University Press:  06 March 2019

W. Barclay Jones  and
Robert A. Carpenter
W. Barclay Jones
Affiliation:
Technical Measurement Corporation Special Products Division, San Mateo, California
Robert A. Carpenter
Affiliation:
Technical Measurement Corporation Special Products Division, San Mateo, California
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Abstract

Recent advances in semiconductor particle detector resolutions along with new electronic circuitry associated with these detectors make possible their application in nondispersive elemental analysis. The use of radioactive sources for exciting the characteristic X-rays provides highly stable systems which can be used to accumulate data for prolonged periods. Due to the inherent stability of the detector and the excitation source, the only limitation in sensitivity is the ability to accumulate statistics above the background of scattered counts. Since this method of analysis is nondispersive, it has the capacity to determine many elements simultaneously. Solutions composed of mixtures of three or four elements were studied. The elements selected were bromine, rubidium, and strontium. These elements exhibit wide variations in mass absorption coefficients for the various characteristic X-rays emitted. The concentrations of the elements in solution varied from 10 ppm to 5% by weight. The relative intensities of the characteristic X-ray lines were compared with the concentration of the solutions to establish sensitivity curves and to study linearity of response as well. The interelemental interference was studied and the effect was evaluated for the particular elements under study. Means were developed for predicting and correcting for matrix effects.

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Type
Research Article
Information
Advances in X-Ray Analysis , Volume 11: Sixteenth Annual Conference on Applications of X-ray Analysis, August 9-11, 1967 , 1967 , pp. 214 - 229
Copyright
Copyright © International Centre for Diffraction Data 1967

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References

1. Cook, G. B., Mellish, C. E., and Payne, J. A., “Applications of Fluorescent X-ray Production by Electron Capture Isotopes,” Proc. Intern. Conf. Peaceful Uses At. Energy, 2nd 19: 127, 1958.Google Scholar
2. Leveque, P., Martinelli, P., and Chauvin, R., “Studies and Industrial Applications of Bremsstrahlung from the Beta Rays of Yttrium 90,” Proc. Intern, Conf. Peaceful Uses At. Energy, Geneva, 1955, 15: 142, 1955.Google Scholar
3. Reiffel, L., “Beta Ray Excited Low-Energy X-ray Sources,” Nucleonics 13: 33, 1955.Google Scholar
4. Dothie, H. J. and Gale, B., “Nondispersive X-ray Fluorescence Absorption Edge Spectroscopy,” Spectrochim. Acta 20: 1735–1753, 1964.Google Scholar
5. Seibel, G., Intern. J. Appl. Radiation Isotopes 15: 25–41, 1964.Google Scholar
6. Enomoto, S. and Mori, C., Nondispersive X-ray Spectra-Chemical Analysis Using Nuclear Beta Ray Source, Japan. J. Appl. Phys. 2: 274–280, 1963.Google Scholar
7. Niewodniczanski, J., “Analysis of Copper Ores in Mine Conditions by X-ray Fluorescence Induced by Isotope Sources,” Radioisotopes Instruments in Industry and Geophysics, SM 68/10, Warsaw, 1965.Google Scholar
8. Cameron, J. F. and Rhodes, J. R., “Filters for Energy Selection in Radioisotope X-ray Techniques,” in1 G. L. Clark (ed.), Encyclopedia of X-rays and Gamma Rays, Reinhold Publishing Corp., London and New York, 1963, pp. 387–388.Google Scholar
9. Rhodes, J. R., Ahier, T. G., and Poole, D. O., “Analysis of Zn and Cu Ores by Radioisotope X-ray Fluorescent,” UKAEA, Rept. AERE-R4474, 1964.Google Scholar
10. Florkowski, T., Diunikowski, B., Kosiara, A., and Wasilewska, M., “Analysis of Iron, Zinc, and Copper Ores in the Field and Laboratory by Fluorescence Excited by 3H/Zr Bremsstrahlung,” Radio Chem. Method of Anal., Vol. 11, International Atomic Energy Agency, Vienna, 1965.Google Scholar
11. Darnley, A. G. and Leamy, C. C., “The Analysis of Tin and Copper Ores Using a Portable Radioisotope X-ray Fluorescence Analyzer,” Proc. 1st AEA Symp. Radioisotope Instr. Industry Geophysics, Warsaw, 1965, Vol. 1, International Atomic Energy Agency, Vienna, 1966.Google Scholar
12. Enomoto, S. and Tanemura, T., “X-ray Spectroanalyser Using a Promethium-47 Beta Source,” Proc. 1st AEA Symp. Radioisotope Instr. Industry Geophysics, Warsaw. 1965, Vol. I, International Atomic Energy Agency, Vienna, 1966.Google Scholar
13. Uchida, K., Tominga, H., and Imamura, H., “Light-Elements Simultaneous Analyzer by the X-ray Emission Method Using Alpha and X-ray Sources for Cement Raw Mix Control,” Proc. 1st AEA Symp. Radioisotope Instr. Industry Geophysics, Warsaw 1965 Vol. 1, International Atomic Energy Agency, Vienna, 1966.Google Scholar
14. Cavailles, J. and Martinelli, P., “Continuous Measurement of Galvanization Coatings by Means of X-ray Fluorescence,” Proc. 1st ABA Symp. Radioisotope Instr. Industry Geophysics, Warsaw, 1965, Vol. 1, International Atomic Energy Agency, Vienna, 1966.Google Scholar
15. Ostrowski, K. W., Gorski, L., and Niewodneczanski, T., “Some Applications of Low-Energy Gamma and X-ray Sources in Poland,” Second Symp. Low-Energy X and Gamma Sources and Applications, Austin, Texas, Mar., 1967 (to be published).Google Scholar
16. Margolenas, S., “X-ray Fluorescence Applied to the Measurement of Zinc Coating in the Galvanizing Industry,” Second Symp. Low-Energy X and Gamma Sources and Applications, Austin, Texas, Mar., 1967 (to be published).Google Scholar
17. Robin, G. and Darigny, E., “The Use of X-ray Fluorescence for the Automation of Mail Sorting, Proc. 1st AEA Symp. Radioisotope Instr. Industry Geophysics, Warsaw, 1965, Vol. 1, International Atomic Energy Agency, Vienna, 1966.Google Scholar
18. Darigny, E. and Robin, G., “Application of X-ray Fluorescence to the Automation of Mail Sorting,” Second Symp. Low-Energy X and Gamma Sources and Applications, Austin, Texas, Mar., 1967 (to be published).Google Scholar
19. Sentfleand, F. E. Tanner, A. B., “Mobile X-Ray Fluorescent Detector for Mineral Exploration,” Second Symp. Low-Energy X and Gamma Sources and Applications, Austin, Texas, Mar., 1967 (to be published).Google Scholar
20. Adler, I. and Trombka, J., “Rock Analysis by Alpha Excitation of X-Rays—A Possible Lunar Probe,” Second Symp. Low-Energy X and Gamma Sources and Application, Austin, Texas, Mar., 1967 (to be published).Google Scholar
21. Patterson, J. H., Turkevich, A. L., and Franzgrote, E., “Analysis of Light Elements in Surfaces by Alpha-Particle Scattering,” Proc. Symp. Radioisotope Instr. Industry Geophysics, Warsaw, SM 68/18, 1965.Google Scholar
22. Metzer, A. E., Parker, R. E., and Trombka, J. I., IEEE Trans. NS-B No. 1, pp. 554-561, Feb., 1966.Google Scholar
23. Rhodes, J. R., “Radioisotope X-ray Spectrometry,” Analyst 91: 683, Nov., 1966.Google Scholar
24. Elad, E. and Nakamura, M., “High-Resolution X-ray and Electron Spectrometer,” Nuci. Instr. Metkods 41: 161, 1966.Google Scholar
25. Elad, E., “A Preamplifier with 0.7 keV Resolution for Semiconductor Radiation Detectors,” Nucl. Instr. Methods 37: 327, 1965.Google Scholar
26. Elad, E. and Nakamura, M., “Low-Energy Spectra Measured with 0.7 keV Resolution,” Nucl. Instr. Methods 42: 315, 1966.Google Scholar
27. Jones, W. B. and Carpenter, R. A., “X-ray Fluorescent Analysis of Multiple Component Samples by a Nondispersive System,” Second Symp. Low-Energy X and Gamma Sources and Applications, Austin, Texas, Mar., 1967 (to be published).Google Scholar
28.Nuclear Data Sheets compiled by K. Way et al., Natl. Acad. Sd.—Natl. Res. Council, Publ. 1964.Google Scholar
29. Imamura, H., Uchida, K., and Tominga, H., Radioisotopes (Tokyo) 14: 286, 1965.Google Scholar
30. Pierson, E. D. and Munch, R. H., “Oxide Mixture Analyses for V, Cu, Mo, Ti, Co, and Ni by Fluorescence Spectrometry,” in: Encyclopedia of X and Gamma Rays, Reinhold Publishing Corp., New York, 1963, p. 681.Google Scholar
31. Jones, W. B., “Trace Element Detection by a Nondispersive X-ray Fluorescent Analysis System, “Pittsburg Conference on Analytical Chemistry and Applied Spectroscopy, Mar.10, 1967.Google Scholar
32. Natl. Bur. Std. (U.S.), Misc. Publ. 260.Google Scholar
33. Sellers, B. and Ziegler, C. A., Generation and Practical Use of Monoenergetic X-rays from Alpha-Emitting Isotopes, Proc. 1st Symp. Low-Energy X and Gamma Sources and Applications, ORNL-11C-5, Chicago, 1964.Google Scholar
34. Cameron, J. F. and Florkowski, T., “Radioisotope Sources of Low-Energy Electromagnetic Radiation and Their Use in Analysis and Measurement of Coating Thickness,” Proc. Symp. Low-Energy X and Gamma Sources and Application, ORNL-11C-5, UC-23, 1964.Google Scholar
35. Leroux, Jean, Encyclopedia of X and Gamma Rays, “Absorption Coefficients (Mass), Empirical Determination Between 1 and 50 keV, calculated from Table 1,” Reinhold Publishing Corp., New York, 1963, pp. 11–13.Google Scholar