Hostname: page-component-6898cfcb55-zkb6p Total loading time: 0 Render date: 2026-11-11T21:30:47.367Z Has data issue: false hasContentIssue false
  • English
  • Français

Opportunities for Materials Analysis with Next Generation Synchrotron Sources

Published online by Cambridge University Press:  06 March 2019

Michael Hart
Michael Hart*
Affiliation:
Department of Physics, Schuster Laboratory The University of Manchester, M13 9PL, U.K.
Get access

Abstract

Polycrystalline and powder diffraction is the most commonly practised method of x-ray analysis. During the last decade the construction of dedicated synchrotron radiation sources has resulted in the renaissance of these x-ray analysis methods; ab initio structure analysis and refinement, quantitative analysis of the structure, composition and stress in thin films and on surfaces, have all been improved. New techniques providing extremely high resolution, using anomalous dispersion, diffraction and scattering at grazing incidence to control x-ray penetration depth, have been developed. This brief review of work with W. Parrish at Stanford Synchrotron Radiation Laboratory and R. J. Cernik at the Daresbury Synchrotron Radiation Source is extended to indicate how third generation sources might be exploited in materials science.

Information

Type
VI. XRD Instrumentation, Techniques and Reference Materials
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991, pp. 329 - 332
Copyright
Copyright © International Centre for Diffraction Data 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1. Materials Science Forum, volume 9, edited by C.R.A. Catlow, Trans. Techn. Publications, Switzerland (1986).Google Scholar
2. X-Ray Powder Diffractometry. [Aust. J. Phys 41 (2) (1988)].Google Scholar
3. Materials Science Forum. EPDIC 1 volume edited by H.Gobel. Trans. Techn. Publications, Switzerland (1991) in press.Google Scholar
4. ESRF Powder Diffraction Workshop. 27-28 March 1991. edited by Åke Kvick, ESRF Grenoble, France (1991).Google Scholar
5. Cernik, R.J. and Hart, M., Nucl. Instrum. Meth. A281:403 (1989).Google Scholar
6. Hart, M., Parrish, W., M Bellotto and Lim, G.S., Acta Cryst. A44:193 (1989).Google Scholar
7. Lim, G., Parrish, W., Ortiz, C., Bellotto, M. and Hart, M., J. Mater. Res. 2:471 (1987).Google Scholar
8. Hart, M. and Parrish, W., Mat. Res. Soc. Symp. Proc. 143:185 (1989).Google Scholar
9. Parrish, W., Hart, M., Huang, T.C., and Bellotto, M., Adv. X-Ray Anal. 30:373 (1987).Google Scholar
10. Hart, M., Cernik, R.J., Parrish, W. and Toraya, H., J. Appl. Cryst., 23:286 (1990).Google Scholar
11. Will, G., Masciocchi, N., Hart, M. and Parrish, W. Acta. Cryst., A43:677 (1987).Google Scholar
12. Huang, T.C., Hart, M., Parrish, W. and Masciocchi, N., J. Appl. Phys., 61:2813 (1987).Google Scholar
13. Hart, M., Parrish, W. and N. Masciocchi. Appl. Phys. Lett., 50:897 (1987).Google Scholar
14. Parrish, W., Erickson, C., Huang, T.C., Hart, M., Gilles, B. and Toraya, H., Mat. Res. Soc. Svmp. Proc., (1990) in press.Google Scholar
15. Parrish, W., Hart, M., Toraya, H. and Erickson, C., Stanford Synchrotron Radiation Laboratory. Annual Report. (1990).Google Scholar
16. Berman, L.E. and Hart, M., Nucl. instrum. Meth., A302:558 (1991).Google Scholar