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Routine Crystallite-Size Determination by X-Ray Diffraction Line Broadening

Published online by Cambridge University Press:  06 March 2019

R. C. Rau
R. C. Rau*
Affiliation:
General Electric Company Cincinnati, Ohio
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Abstract

Increasing interest in the sintering characteristics of various ceramic materials has resulted in the need for a knowledge of the crystallite sizes of many constituent ceramic powders. Standard X-ray diffraction line-broadening techniques have been utilized to determine these crystallite sizes. This paper presents a general review of the theory of line broadening as a means of measuring crystallite size and gives the methods and modifications used to perform this type of analysis rapidly and on a routine basis.

Four modifications have been used in the determination of crystallite size routinely by X-ray line broadening. These methods are (1) a graded set of powder photographs, (2) a computer program to calculate sizes from diffractometer data, (3) a set of crystallite-size curves for a given material for use with diffractometer data, and (4) a standard set of curves to use with diffractometer data for any strain-free materials. The preparation, use, and limitations of each of these methods is presented.

Information

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 5: Tenth Annual Conference on Applications of X-ray Analysis, August 7-9, 1961 , 1961 , pp. 104 - 116
Copyright
Copyright © International Centre for Diffraction Data 1961

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References

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