Hostname: page-component-7b7567c8c-7pwfn Total loading time: 0 Render date: 2026-11-13T11:08:51.706Z Has data issue: false hasContentIssue false
  • English
  • Français

RS/hyper: A Hypertext-Based Workstation for Reliable X-Ray Residual Stress Measurements

Published online by Cambridge University Press:  06 March 2019

A. Ward III,
R. W. Hendricks and
M. Brauss
A. Ward III
Affiliation:
Department of Materials Science and Engineering, Virginia Polytechnic Institute and State University, Blacksburg, Virginia, USA 24061
R. W. Hendricks
Affiliation:
Department of Materials Science and Engineering, Virginia Polytechnic Institute and State University, Blacksburg, Virginia, USA 24061
M. Brauss
Affiliation:
Proto Manufacturing Limited, 2175 Solar Crescent Oldcastle, Ontario, Canada NOR 1L0
Get access

Abstract

Advances over the last ten years in computer automation and control, compact and portable x-ray sources, and reliable and efficient detector systems have allowed X-Ray Determination of Residual Stress (XRDRS) measurements to become a viable method of evaluating the state of stress in metals, alloys, and ceramics. However, problems associated with incorrect XRDRS equipment operation and poor experimental technique are prevelant in industry, necessitating better operator training and education. Therefore, an interactive computer workstation, called RS/hyper, was developed to lead the operator towards correct operating procedures and reliable experimental technique.

Proper machine setup, machine maintenance, radiation safety, experimental technique, theoretical understanding, and limited data evaluation are presented in RS/hyper. Graphical aids are used extensively to avoid confusion and misinterpretation of theoretical concepts and equipment instructions. RS/hyper is interactive, allowing the user to learn about topics at a comfortable level of explanation. Compared to written texts and references, RS/hyper has been shown to reduce training and problem solving time by a factor of 16.

RS/hyper will train novice users of XRDRS equipment so that the data acquired from such machines will be reliable in an industrial environment. Also, since the software educates the user, data will be more accurately represented before interpretation. The experienced user should find RS/hyper useful as a reference to XRDRS and related information.

Information

Type
IX. Stress and Strain Determination by Diffraction Methods, Peak Broadening Analysis
Information
Advances in X-Ray Analysis , Volume 36: Forty-First Annual Conference on Applications of X-ray Analysis, August 3-7, 1992 , 1992, pp. 527 - 533
Copyright
Copyright © International Centre for Diffraction Data 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

[1] Ward, A., “RS/hyper: A Hypertext Solution for Reliable Residual Stress Determination Using X-Ray Diffraction,” MSc Thesis, Materials Science and Engineering Department, Virginia Polytechnic Institute and State University, Blacksburg, Virginia, (August 1992).Google Scholar
[2] Courtney, S., Tricard, M., and Hendricks, R. W., “PC-Based Management and Analysis of X-Ray Residual Stress Measurements,” Advances in X-Ray Analysis, 36, (1992), (this volume).Google Scholar
[3] Courtney, S., Potet, J., Tricard, M., and Hendricks, R. W., “RS/b ase: A Residual Stress Data Base Management System,” Residual Stress-Ill: Science and Technology, Proceedings of an International Conference, Tokushima, Japan, 23-26 July, 1991, H. Fujiwara, T. Abe, and K. Tanaka, eds., Amsterdam: Elsevier, (1992), pp, 1549-1554.Google Scholar
[4] Hendricks, R. W., “RS/cite: A Computerized Bibliographic Database of the Residual Stress Literature.” Residual Stress-Ill: Science and Technology, Proceedings of an International Conference, Tokushima, Japan, 23-26 July, 1991, II, Fujiwara, T. Abe, and K. Tanaka, eds., Amsterdam: Elsevier, (1992), pp. 1543-1548.Google Scholar
[5] Tricard, M., “An Expert System for the Validation and Interpretation of X-Ray Residual Stress Data,” MSc Thesis, Materials Science and Engineering Department, Virginia Polytechnic Institute and State University, Blacksburg, Virginia, (May 1992).Google Scholar
[6] Tricard, M., Hendricks, R. W., and Guillot, M., “An Expert System for the Validation and Interpretation of Residua] Stress Data,” Advances in X-Ray Analysis. 34. (1990), pp. 601–610.Google Scholar
[7] Dehan, C. F., “An Intelligent Workstation for Reliable Residual Stress Determination Using X-Ray Diffraction,” MSc Thesis, Materials Science and Engineering Department, Virginia Polytedmic Institute and State University, Blacksbnrg, Virginia (July 1989).Google Scholar
[8] Dehan, C.F., Hendricks, R. W., and Roach, J. W., “An Intelligent Workstation for Reliable Residual Stress Determination Using X-R.ay Diffra.ction,” Residual Stress- It: Science and Technology, Proceedings o! an International Conference, G. Beck, S.Denis, and A. Simon, eds., Amsterdam: Elsevier, (1989), pp, 39-45.Google Scholar