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Sensitivity and Detectability Limits for Elemental Analysis by Proton-Induced X-Ray Fluorescence with a 3 MV Van De Graaff*

Published online by Cambridge University Press:  06 March 2019

C. J. Umbarger,
R. C. Bearse,
D. A. Close and
J. J. Malanify
C. J. Umbarger
Affiliation:
University of California, Los Alamos Scientific Laboratory, Los Alamos, New Mexico 87544
R. C. Bearse
Affiliation:
University of California, Los Alamos Scientific Laboratory, Los Alamos, New Mexico 87544
D. A. Close
Affiliation:
University of California, Los Alamos Scientific Laboratory, Los Alamos, New Mexico 87544
J. J. Malanify
Affiliation:
University of California, Los Alamos Scientific Laboratory, Los Alamos, New Mexico 87544
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Abstract

Protons from a 3 MV Van de Graaff have been used to produce characteristic x-rays from 21 elements spanning the periodic table. Absolute Kα and Lα x-ray production cross sections have been determined, allowing one to calculate sensitivities for any given sample, detector geometry, and proton beam parameters. Elemental detectability limits are discussed assuming various backings (e.g., mylar, kapton, etc.) and matrix materials. The large number of available small proton accelerators throughout the United States promises wide applicability of this technique to environmental and biomedical analysis.

Information

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 16: 'Twenty-First Annual Conference on Applications of X-ray Analysis, August 2-4, 1972 , 1972, pp. 102 - 110
Copyright
Copyright © International Centre for Diffraction Data 1972

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Footnotes

†

Visiting Staff Member from University of Kansas, Lawrence, Kansas.

*

A Work performed under the auspices of the U. S. Atomic Energy Commission.

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