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Size-Strain and Quantitative Phase Analysis by the Rietveld Method

Published online by Cambridge University Press:  06 March 2019

Paolo Scardi,
Luca Lutterotti and
Rosa Di Maggio
Paolo Scardi
Affiliation:
Department of Materials Engineering, University of Trento 38050 Mesiano (Trentoi), Italy
Luca Lutterotti
Affiliation:
Department of Materials Engineering, University of Trento 38050 Mesiano (Trentoi), Italy
Rosa Di Maggio
Affiliation:
Department of Materials Engineering, University of Trento 38050 Mesiano (Trentoi), Italy
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Abstract

A modified version of the Rietveld method has been developed for quantitative phase analysis in conjunction with crystallite size and microstrain determination.

Besides the information on the microstructural disorder in the different phases present in the sample, accurate phase analysis can be performed, even in presence of anisotropic crystallites, taking into account the non-instrumental peak broadening effect in a better way compared to conventional methods.

The method has been tested on binary mixtures of corundum, ceria stabilized zirconia and on a polyphase stabilized zirconia sample.

Information

Type
I. Whole Pattern Fitting, Rietveld Analysis and Calculated Diffraction Patterns
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991, pp. 69 - 76
Copyright
Copyright © International Centre for Diffraction Data 1991

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