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Standard Reference Materials and Meaningful X-Ray Measurements

Published online by Cambridge University Press:  06 March 2019

H. Thomas Yolken
H. Thomas Yolken*
Affiliation:
Institute for Materials Research, National Bureau of Standards, Washington, D.C. 20234
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Abstract

A review of the procedures and efforts at the National Bureau of Standards (NBS) to provide for meaningful measurements through the use of Standard Reference Materials (SRM's) is presented.

The examples of NBS Standardization efforts for x-ray analysis range from basic metrology to applied environmental measurements. These examples include a determination of x-ray wavelength by a method which in part utilizes simultaneous x-ray and optical interferometry measurements of the atomic planes of near perfect silicon. In addition, Standard Reference Materials (SRM's) are being developed and applied to trace element analysis using x-ray fluorescence techniques. These efforts include development of SRM's for trace element analysis of air particulates. In another area, work is proceeding on the development of a silicon powder Standard Reference Material intended for x-ray diffractometer calibration. An effort to develop a suitable x-ray diffraction technique to determine the amount of quartz in mine dust is also underway. NBS efforts to provide SRM's for the calibration of electron microprobes and the validating of correction factor calculations are also described.

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Type
Research Article
Information
Advances in X-Ray Analysis , Volume 17: Twenty-Second Annual Conference on Applications of X-ray Analysis, August 22-24, 1973 , 1973, pp. 1 - 15
Copyright
Copyright © International Centre for Diffraction Data 1973

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References

1. Deslattes, Richard D., “X-Ray/Optical Interferometry and X-Ray Fundamental Constants Measurements,” Proceedings of the International Conference on Precision Measurement and Fundamental Constants, National Bureau of Standards, August 1970, NBS Spec. Publ. 343, U. S. Government Printing Office, Washington, D. C. 20234, 1971.Google Scholar
2. Sanders, J. H. and Wapstra, A. H., “Atomic Masses and Fundamental Constants,” Proceedings of the Fourth International Conference on Atomic Masses and Fundamental Constants held at Teddington, England, September 1971, Plenum Press, New York 1972.Google Scholar
3. Giauque, Robert D., Goulding, Fred S., Jaklevic, Joseph M., and Pehl, Richard H., “Trace Element Determination with Semiconductor Detector X-Ray Spectrometers,” Anal. Chem. 451, 671–681 (April 1973).Google Scholar