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Stress Measurements with a Two-Dimensional Real-Time System
Published online by Cambridge University Press: 06 March 2019
Extract
Conventional methods of determination of residual stress in polycrystalline samples use either diffractometers or one-dimensional position-sensitive detectors. The most commonly used technique, the so-called "sin2ψ" method, requires several measurements at different angular positions of the sample. With diffractometers, two rotations are required, while with one-dimensional detectors, one rotation is required (except for the so-called single exposure technique, which requires two one-dimensional position-sensitive detectors). Rotation can be a potential source of errors if the sample is not aligned very carefully.
Information
- Type
- VII. X-Ray Stress Analysis
- Information
- Copyright
- Copyright © International Centre for Diffraction Data 1988
References
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