Hostname: page-component-6898cfcb55-kwdml Total loading time: 0 Render date: 2026-11-11T10:50:04.115Z Has data issue: false hasContentIssue false

Stresses in Thin Films

Published online by Cambridge University Press:  06 March 2019

Jerome B. Cohen*
Affiliation:
Department of Materials Science and Engineering, Robert R. McCormick School of Engineering and Applied Science, The Technological Institute, Northwestern University, Evanston, IL 60208
Get access

Extract

While any subject associated with films evokes immediate thoughts about solid-state devices, there are other much more mature areas where it is important, such as coatings, and yet work on this entire subject is only in its infancy. Residual stresses are not only important because of their well-known effect on corrosion and mechanical properties, they can also lead to other severe problems. For example, it is now believed that stress gradients can lead to void formation and subsequent failure in metallization in electronic devices. Thus, it is not only the level of stress that can be important, but gradients across a surface of a thin stripe, or through the thickness.

Information

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable