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Substructure-Magnetic Property Correlation in Fe/Ag Composite Thin Films

Published online by Cambridge University Press:  06 March 2019

C. P. Reed ,
R. J. DeAngelis ,
Y. X. Zhang ,
S. H. Liou  and
R. J. Jacob
C. P. Reed
Affiliation:
Center for Materials Research and Analysis University of Nebraska-Lincoln Lincoln, NE
R. J. DeAngelis
Affiliation:
Center for Materials Research and Analysis University of Nebraska-Lincoln Lincoln, NE
Y. X. Zhang
Affiliation:
Center for Materials Research and Analysis University of Nebraska-Lincoln Lincoln, NE
S. H. Liou
Affiliation:
Center for Materials Research and Analysis University of Nebraska-Lincoln Lincoln, NE
R. J. Jacob
Affiliation:
Nano Probe Lab Markey Cancer Center University of Kentucky Lexington, KY
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Abstract

A series of nanostructured Fe/Ag metal films were produced at various substrate temperatures to determine their magnetic characteristics. The magnetic coercivity was found to increase with the diffracting-particle size which is process controlled. The films produced at low substrate temperature (<200°C) consisted of small metallic clusters of Ag (<100 Å). As the substrate temperature was increased, the films exhibited increased crystallinity and larger diffracting-particle size. The position of the maximum in the particlesize distribution function and the width of the function increased with substrate temperature.

Information

Type
XI. Thin Film and Semiconductor Characterization by X-Ray Diffraction
Information
Advances in X-Ray Analysis , Volume 34: Thirty-Ninth Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1990 , 1990 , pp. 557 - 565
Copyright
Copyright © International Centre for Diffraction Data 1990

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References

(1) DeAngelis, J. R. J., Dhere, A. G., Lewis, J. D., Kuo, H., Application of X-Ray Diffraction Techniques to Study the Sintering of Catalysts, Sintering and Heterogeneous Catalysts. 182–184, Plenum Publishing Corp., 1984.Google Scholar
(2) Gangulee, A., J. Appl. Crystalloqr., 7: 434, 1974.Google Scholar
(3) Mignot, J., Rondot, D., Acta. Met., 23: 1322, 1975.Google Scholar
(4) Rothman, R. L., Cohen, J. B., Advan. X-Ray Anal., 12: 208, 1969.Google Scholar
(5) DeAngelis, R. J., Dhere, A. G., Maginnis, M. A., Reucroft, P. J., Ice, G. E., Habenschuas, A., Synchrotron X-Ray Scattering for the Structural characterization of Catalysts, Advan. X-Ray Anal., 389–394, Plenum Publishing Corp., 1987.Google Scholar
(6) Lewis, J. D., “Particle Size Analysis on Simulated X-Ray Diffraction Profiles,” Thesis, University of Kentucky, 1984.Google Scholar
(7) Chopra, K. L., “Thin Film Phenomena,” McGraw-Hill Book Co., 1969.Google Scholar
(8) Luborsky, F. E., J. Appl. Phys., 1715: 32, 1961.Google Scholar
(9) Zhang, Y. X., Liou, S. H., DeAngelis, R. J., Lee, K. W., Reed, C. P., Nazareth, A., The Process-Controlled Magnetic Properties in Nanostructured Fe/Ag Composite Films, to appear in J. Appl. Phys., April, 1991.Google Scholar