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Synchrotron Radiation X-Ray Fluorescence Analysis

Published online by Cambridge University Press:  06 March 2019

John V. Gilfrich
John V. Gilfrich*
Affiliation:
Dynamics of Solids Branch, Naval Research Laboratory, Washington, DC 20375-5000
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Extract

The physical principles giving rise to synchrotron radiation(SR), the facilities necessary to make use of this source of radiation and the way in which it can be used for x-ray diffraction experiments have been described in other parts of this proceedings. The use of synchrotron radiation as an excitation source for x-ray fluorescence takes advantage of many of its unique properties to provide the potential for an improved analytical capability, beyond that which can be realized with more conventional laboratory x-ray sources. Workers around the world are studying this application (as well as a wide variety of others) , to establish the potential of this technique. Table 1 lists some of the facilities where significant XRF effort is being expended. This list is not intended to be complete, but just to convey some idea of the magnitude of the research which is being carried out.

Information

Type
I. High Brilliance Sources/Applications
Information
Advances in X-Ray Analysis , Volume 32: Thirty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-5, 1988 , 1988, pp. 1 - 7
Copyright
Copyright © International Centre for Diffraction Data 1988

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References

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