Hostname: page-component-7b7567c8c-7pwfn Total loading time: 0 Render date: 2026-11-14T19:54:23.725Z Has data issue: false hasContentIssue false

Synchrotron X-ray Microbeam Characteristics for X-ray Fluorescence Analysis

Published online by Cambridge University Press:  06 March 2019

A. Iida
Affiliation:
Photon Factory, National Laboratory for High Energy Physics 1-1 O-ho, Tsukuba Ibaraki 305, Japan
T. Noma
Affiliation:
Canon Research Center, Canon Inc. Morinosato-Wakamiya, Atsugi Kanagawa 243-01, Japan
Get access

Extract

X-ray fluorescence analysis using a synchrotron x-ray microprobe has become an indispensable technique for non-destructive micro-analysis. One of the most important parameters that characterize the x-ray microbeam system for x-ray fluorescence analysis is the beam size. For practical analysis, however, the photon flux, the energy resolution and the available energy range are also crucial. Three types of x-ray microbeam systems, including monochromatic and continuum excitation systems, were compared with reference to the sensitivity, the minimum detection limit and the applicability to various types of x-ray spectroscopic analysis.

Information

Type
IV. New Developments in X-Ray Sources, Instrumentation and Techniques
Copyright
Copyright © International Centre for Diffraction Data 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable