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Thin-Film X-Ray Spectroscopy

Published online by Cambridge University Press:  06 March 2019

J.J. Finnegan
J.J. Finnegan*
Affiliation:
U.S. Army Signal Research and Development Laboratory Fort Monmouth, New Jersey
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Abstract

Quantitative de terminations of thickness and composition are presented for 100- to 10,000-A iron-nickel films. Calibration of X-ray intensities with interferometric and calorimetric values give linear plots for films deposited on Mylar or glass substrates. Application of a film-casting technique shows promise of alleviating two of the problems encountered in X-ray spectroscopy, i.e., matrix-effect-caused deviations from proportionality and the lack of standards for calibration of many types of material.

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Type
Research Article
Information
Advances in X-Ray Analysis , Volume 5: Tenth Annual Conference on Applications of X-ray Analysis, August 7-9, 1961 , 1961, pp. 500 - 511
Copyright
Copyright © International Centre for Diffraction Data 1961

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References

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