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A Versatile Vacuum Scanning Double Crystal Spectrometer for Soft X-Ray Absorption Edge Studies

Published online by Cambridge University Press:  06 March 2019

A.S. Bhalla and
E.W. White
A.S. Bhalla
Affiliation:
Pennsylvania State University
E.W. White
Affiliation:
University Park, Pennsylvania 16802
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Abstract

Studies of the fine structure of absorption edges in the soft x-ray region are becoming increasingly important as a tool for materials characterization. Examples of application includes determination of chemical state of elements, bonding and band structure studies. Intensity and resolving power of the x-ray spectrometer are important experimental considerations. As a rule adjustment of instrumental parameters, such as collimation, to give increased intensity adversely affect resolving power. Optimization of intensity and resolving power must therefore he achieved.

A newly designed double crystal spectrometer has been constructed for high-resolution absorption edge studies in the wavelength region of 5Ǻ to 70Ǻ.

The entire system is enclosed in a vacuum chamber ion pumped to the 10-7 torr range. The second crystal motion is obtained by means of an ULTRADEX 360-sided polygon and sine arm that is automatically step-scanned. The spectrometer functions equally well in the (l, + l) and (l, - l) orientation and as a precise single crystal spectrometer.

Information

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 13: Eighteenth Annual Conference on Applications of X-ray Analysis, August 6-8, 1969 , 1969, pp. 272 - 288
Copyright
Copyright © International Centre for Diffraction Data 1969

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