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X-Ray Characteristics and Applications of Layered Synthetic Microstructures

Published online by Cambridge University Press:  06 March 2019

J. V. Gilfrich,
D. J. Nagel,
N. G. Loter and
T . W. Barbee
J. V. Gilfrich
Affiliation:
Naval Research Laboratory, Washington, DC 20375
D. J. Nagel
Affiliation:
Naval Research Laboratory, Washington, DC 20375
N. G. Loter
Affiliation:
Naval Research Laboratory, Washington, DC 20375
T . W. Barbee
Affiliation:
Stanford University, Stanford, CA 94305
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Extract

Practitioners of wavelength-dispersive x-ray spectroscopy are always seeking better dispersing devices. The wavelength-dispersive instrument is called a “crystal spectrometer” because natural or synthetically-grown crystals are most often used. Occasionally, other “manufactured” dispersers are suggested for specific applications: highly oriented polycrystalline graphite provides much higher intensities than the crystals usually used for the K-lines of P, S and Cl; Langmuir-Blodgett films (heavy metal salts of fatty acids) provide 2d-spacings over the range of 70 to 130 A, making soft x-ray spectroscopy practical in a wavelength range for which natural crystals are not available.

Information

Type
VIII. XRD Applications
Information
Advances in X-Ray Analysis , Volume 25: Thirtieth Annual Conference on Applications of X-ray Analysis, August 3-7, 1981 , 1981, pp. 355 - 364
Copyright
Copyright © International Centre for Diffraction Data 1981

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References

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