Hostname: page-component-7b7567c8c-7pwfn Total loading time: 0 Render date: 2026-11-15T16:31:14.299Z Has data issue: false hasContentIssue false
  • English
  • Français

X-Ray Fluorescence Analysis for Sodium, Fluorine, Oxygen, Nitrogen, Carbon, and Boron*

Published online by Cambridge University Press:  06 March 2019

Burton L. Henke
Burton L. Henke*
Affiliation:
Pomona College Clarentont, California
Get access

Abstract

Optimized vacuum spectrographic measurement of low-energy fluorescence has been found to yield counting rates and peak-to-background ratios which are enough to permit the extension of fluorescence analysis for elementary chemistry into the light-element range—sodium through boron. This is accomplished with an efficient, demountable ultrasoft X-ray source, with close coupling among source, crystal, and detector, with KAP and multilayered stearate analyzers, and with, optimized flow-propordonal counting. Specific methods for achieving peak-to-background ratios on practical samples containing these light elements are presented. The extension of these methods of light-element analysis with the use of curved long-spaced crystals for X-Ray macroprobe and electron microprobe measurements is discussed. The design and construction of multilayered soap film “crystals” for long-wavelength X-ray analysis is described.

Information

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 7: Twelfth Annual Conference on Applications of X-ray Analysis, August 7-9, 1963 , 1963, pp. 460 - 488
Copyright
Copyright © International Centre for Diffraction Data 1963

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

Footnotes

*

Now on leave at the Los Alamos Scientific Laboratory, Los Alamos, New Mexico.

1

This work is supported under a grant from the Office of Scientific Research, U.S. Air Force.

References

References

1. Henke, B. L., “Sodium and Magnesium Analysis-Method” and A. K. Baird, D. B. Mclntyre, and E. E. Welday, “Sodium and Magnesium Analysis-Application to Silicates,” Advances in X-Ray Analysis, Vol. 6, University of Denver, Plenum Press, N.Y., 1963.Google Scholar
2. Gillespie, A. S. Jr., and Hill, W. W., “Sensitivities for Activation Analysis with 14-MeV Neutrons,” Nucleonics, November, 1961.Google Scholar
3. Markowitz, S. S. and Mahony, J. D., “Activation Analysis for Oxygen and Other Elements by Helium-3 Induced Nuclear Reactions,” Anal. Chem. 34: 329, 1962.Google Scholar
4. Henke, B. L., “Submicroscopic Structure Determination by Long-Wavelength X-Ray Diffraction,” J. Appl. Phys. 26: 903, 1955.Google Scholar
5. Merritt, J., Miller, C. E., Sawyer, W. M., and Teller, A., “Modification of Electron Probe to Detect Carbon,” Anal. Chem. (in press).Google Scholar
6. Baun, W. and Fischer, D., “Preparation and Use of Organic Compounds for Use as Dispersing Devices for Long-Wavelength X-Rays,” ASD-TDR-63-310, 1963.Google Scholar

Techniques for Building up Multilayer Films

7. Blodgett, K. B., J. Am. Chem. Soc, 57: 1007, 1935.Google Scholar
8. Btodgett, K. B., J. Phys. Chem. 41: 975, 1937.Google Scholar
9. Blodgett, K. B. and Langmuir, I., Phys. Rev. 51: 964, 1937.Google Scholar
10. Langmuir, I., Proc. Roy. Soc. A170: 1, 1939.Google Scholar
11. Langmuir, I. and Schaefer, V. J., J. Am. Chem. Soc, 58: 284, 1936.Google Scholar
12. Sker, I. H. and Chanky, J. D., Rev. Sci Instr. 26: 266, 1935.Google Scholar
13. Beard, D. W. and Furnas, T. C. Jr., ASD-TDR-62-518, 1962.Google Scholar

Structure of Multilayer Films

14. Germer, L. H. and Storks, K. H., J. Chem. Pkys. 6: 280, 1938.Google Scholar
15. Havinga, E. and de Wael, J., Rec. Trav, Chim. 56: 375, 1937.Google Scholar
16. Langmuir, I., Science 87: 493, 1938.Google Scholar
17. James, R. W., The Optical Principles of the Diffraction of X-Rays, G. Bell and Sons Ltd, London, 1954.Google Scholar
18. Henke, B. L. and Miller, J. C., “Ultrasoft X-Ray Interaction Coefficients,” AFOSR TN 59-895 1959.Google Scholar
19. Henke, B. L., White, R., and Lundberg, B., “Semiempirical Determination of Mass Absorption Coefficients for the 5 to SO A Region,” J. Appl. Phys. 28: 98, 1957.Google Scholar